Faculty and Research Scientists
| Bio | Research Areas | Contact |
| Prof. Michael Pecht | Reliability & Supply Chain Policies | 301-405-5323 pecht@umd.edu |
| Dr. Michael Osterman | Testing and Simulation Based Failure Assessment | 301-405-8023 osterman@umd.edu |
| Dr. Michael H. Azarian | Failure Analysis, Prognostics and Health Management, Electrical Contacts, Passive Components, Counterfeit Detection and Mitigation | 301-405-7555 mazarian@calce.umd.edu |
| Prof. David Bigio | Polymers | 301-405-5258 bigio@eng.umd.edu |
| Prof. Aris Christou | Flexible Displays, Semiconductor Reliability | 301-405-5208 christou@umd.edu |
| Dr. Diganta Das | Parts Selection & Management, Uprating, Component Reliability | 301-405-5323 diganta@umd.edu |
| Prof. Siddhartha Das | Soft Capillarity and Wetting, Micro-nanoscale transport | 301-405-6633 sidd@umd.edu |
| Prof. Abhijit Dasgupta | Interconnect Reliability, Accelerated Testing | 301-405-5251 dasgupta@umd.edu |
| Prof. Bongtae Han | Reliability Assessment of Packaging Materials, Components and Assemblies | 301-405-5255 bthan@umd.edu |
| Prof. Patrick McCluskey | Power Electronics, Component Reliability | 301-405-0279 mcclupa@umd.edu |
| Prof. Michael Ohadi | Thermal Management | 301-405-5263 ohadi@eng.umd.edu |
| Prof. Peter Sandborn | Technology Tradeoff Analysis, Life Cycle Cost | 301-405-3167 sandborn@umd.edu |
| Dr. Robert Utter | Electronic Product Development, Failure Analysis | (301)-405-3884 rgutter@umd.edu |
Research Students
| Abhishek Ram | Efficacy of Screening and Burn-In | aram8@umd.edu |
| Beihan Zhao | Development and Testing of CNT and Metallic Nanoparticle-based Inks for 3D Printing | bzhao12@umd.edu |
| Brett Setera | Wide Bandgap Semiconductor Reliability | bsetera@umd.edu |
| Changsu Kim | Electronic Packaging and Reliability, Characterization of Polymers | csk@umd.edu |
| Chintankumar Patel | Component Management | cpatel98@umd.edu |
| Christopher Riso | 3D Printed Electronic Components | chriso@umd.edu |
| Clifton Buxbaum | Integrated 3D Packaged DC-DC Converter | cbux6@umd.edu |
| David Leslie | Physics of Failure of Complex Outdoor Lighting Systems | eguti007@terpmail.umd.edu |
| Declan Mallamo | Prognostics and Reliability of Complex Aircraft Systems | mgutierr@umd.edu |
| Deng Yun Chen | Solder Interconnect Life Modelings | zhe12@umd.edu |
| Devon Richman | Identifying Counterfeit or Clone Electronic Component | prabhatj@umd.edu |
| Erick Gutierrez | Transient Liquid Phase Sintering | jayanthi@umd.edu |
| Gilad Nave | Transient Liquid Phase Materials Pastes | vkheman@terpmail.umd.edu |
| Hamidreza Habibollahi Najaf Abadi | Prognostic and Health Management, Reliability of Connectors | csk@umd.edu |
| He Yun | Manufacturability and Reliability of Additively Manufactured Planar Transformer Windings Using Silver-based Pastes | lkong@umd.edu |
| Hirbod Akhavantaheri | Network Modeling of Counterfeit Electronics Supply Chain | nklee@umd.edu |
| Hisham Abusalma | Reliability of Electronics | dleslie@calce.umd.edu |
| Jack Yang | Reliability of Semiconductor Packaging, Uncertainty Propagation Analysis | xiao365@umd.edu |
| Jacob Welch | Fatigue Damage Caused by Repeated Impacts in Electronic Assemblies | lvyz123@umd.edu |
| Kunal Ahuja | Trench Capacitor Reliability | dmallamo@umd.edu |
| Lekhith Yelamanchili | Electronics Reliability | gnave@umd.edu |
| Lingxi Kong | Battery Reliability and Safety | cpatel98@umd.edu |
| Lokesh Sangepu | Packaging Reliability | anto@calce.umd.edu |
| Mauricio Gutierrez | Prognostics and Lithion Batteries | sukrutp@umd.edu |
| Naga Siva Srinivas Putta | Simulations and assessment of different topologies for power electronic converters | nagasiva@umd.edu |
| Namkyoung Lee | Prognostics and Health Management | aram8@umd.edu |
| Peter Anto | Physics-Of-Failure and Reliability Testing of Capacitor Technologies | drichman@umd.edu |
| Prabhat Janamanchi | Adhesive Joint Reliability | chriso@umd.edu |
| Shao-Peng Chen | Open-Systems Procurement and Sustainment | spchen@umd.edu |
| Sriram Jayanthi | Reliability Impacts of Underfill Selection | yonsa22@gmail.com |
| Sukrut Phansalkar | Reliability of Semiconductor Packaging, Uncertainty Propagation Analysis | lokesh@umd.edu |
| Swarup Kumar Subudhi | Development, Printing, and Testing of Soft Magnetic Films and CNT-GO based Electronics | swarupks@umd.edu |
| Varun Khemani | Prognostics and Health Management of Electronics | swarupks@umd.edu |
| Xiao Lin | Fatigue Damage Caused by Multiaxial Vibration Excitation in Electronic Assemblies | jwelch23@terpmail.umd.edu |
| Yizhou Lu | Reliability of Power Electronic Modules for Off-Shore Wind Turbines | yhyangv@umd.edu |
| Yonatan Saadon | Reliability of Power Electronic Modules for Off-Shore Wind Turbines | zxyao@terpmail.umd.edu |
| Yonatan Saadon | Power Module Reliability | yonsa22@gmail.com |
| Zhaoxi Yao | Aircraft Smart Motor Thermal Management and Reliability | zxyao@terpmail.umd.edu |
| Zhou He | Water Ingress Protection Testing and Assessment of Portable Electronics | zhe12@umd.edu |
| Name | Supervisor or Host | Current |
| Hannah L. Mathew | Dr. Diganta Das | South River High School |
| Dr. Hector Beltran San Segundo | Prof. Michael Pecht | Universitat Jaume I de Castelló |
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