Technical Program
Contact: Diganta Das (diganta@umd.edu) for more information.
| ► All times shown are in US Eastern Time Zone | ||
| Tuesday, August 03 | ||
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Session 1: Counterfeit Statistics and Direction
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Moderator: Diganta Das, Ph.D., University of Maryland | |
| 8:15am | Opening Remarks | Diganta Das, Ph.D., and Tanya Martin, Executive Direcor, SMTA |
| 8:30am | Invited Opening Talk: Modern, Complex Cloned Devices: How Do They Compare to Authentic Components and Traditional Counterfeits? | Nicholas Williams, Ph.D., SMT Corp |
| 9:15am | Trends in Counterfeit Electronics - a Data-Driven Analysis | Fred Schipp, Ph.D., NSWC Crane |
| 9:45am | Industry Standards to Mitigate Counterfeit Risk in the Supply Chain | Jim Creiman, Northrup Grumman |
| 10:15am | Break – Visit with Sponsors and Networking and Q&A on Session 1 | |
| Session 2: Supply Chain Evolution | Moderator: Kevin Sink, TTI, Inc. | |
| 10:30am | Enterprise Network Models for Counterfeit Part Supply Chains |
Hirbod Akhavantaheri (with Dr. Diganta Das and Prof. Peter Sandborn), University of Maryland |
| 11:00am | Enhance Supply Chain Security and Technology Development Practices Through O-TTPS / ISO 20243 Certification | |
| 11:30am | Avoiding Fraud and Identity Theft While Sourcing Hard-to-Find Parts During a Global Chip Shortage | Richard Smith, ERAI |
| 12:00pm | The Impact of Obsolescence and Shortages on Counterfeit Risk | Vernon Densler, Sourceability |
| 12:30pm | Break – Visit with Sponsors and Networking and Q&A on Session 2 | |
| Session 3: Side Channel based Detection | Moderator: Diganta Das, Ph.D., University of Maryland | |
| 1:30pm | Comparative Assessment of Side Channel, Machine Vision, and Standards-Based Methods for Counterfeit Detection and Prevention | Michael H. Azarian, Ph.D. (with Diganta Das, Ph.D., and Devon Richman), University of Maryland |
| 2:00pm | Evaluating the Effectiveness of Second Order Effect (2OE) Methods to Mitigate Specific Supply Chain Risks | Brendan Foran, Ph.D., The Aerospace Corporation |
| 2:30pm | Electronic Component Authenticity via Electrical Signal Measurement and Artificial Intelligence with Deep Learning | Junjie Xiong, University of South Florida |
| 3:00pm | Break – Visit with Sponsors and Networking and Q&A on Session 3 | |
| Session 4: Tracking and Machine Vision | Moderator: Bill Cardoso, Ph. D., Creative Electron Inc. | |
| 3:30pm | Method to Mitigate Electronic Component Shortages and Validate Secondary Market Unauthorized Components | Eyal Weiss, Ph.D., Cybord (with Tovi Yadin, Siemens) |
| 4:00pm | Machine Learning and Machine Vision Systems for Microelectronic Screening | Naresh Menon, Ph. D., Covisus |
| 4:30pm | X-ray Image Registration Technique | Bill Cardoso, Ph.D., Creative Electron Inc. |
| 5:00pm | Supply Chain Traceability: Identifying and Eliminating Counterfeit Parts | Matt Bellis, SAVTEQ (Seikowave Advanced Visual Technology) |
