Abstract: With support from the Defense Microelectronics Activity (DMEA), we are developing DTEK 3.0 to support the ongoing Department of Defense (DOD) challenge to ensure the authenticity and security of microelectronics parts within its supply chain. The automated machine vision system is designed to capture SAE AS 6171/2 EVI test methods as well as the surface features of a microelectronic component and using machine learning algorithms to determine if the component is suspect or not. The technology is based on our proven products currently being used within the DOD supply chain to protect it from counterfeit components. In this paper, we will discuss the performance of this system.

Bio: As the founder of Covius, Naresh has over 30 years of industrial Research, Development and Product launch experience. He is passionate about addressing the crisis caused by counterfeit and substandard products that are impacting consumer confidence in E-commerce, disrupting our military supply chain and endangering patients. Naresh brings a unique approach to industrial problems that combines bioinspired disruptive science with the practical operational needs of manufacturing. This has resulted in disruptive solutions that have been deployed by Government and Fortune 100 companies in manufacturing and distribution. He received his PhD in Physics from Purdue University with an emphasis in sensor fabrication, instrumentation and novel data analytic methods that were applied at multiple national and international laboratories towards fundamental physics discoveries. His early career was spent at Corning Incorporated and Northrop Grumman Mission Systems where he was groomed for leadership positions in multiple businesses. Covisus was spun-out in 2015 from ChromoLogic LLC (www.chromologic.com); an innovation center that focuses on developing deep-tech solutions that save lives and make the world secure.