Dr.Michael H. Azarian is an assistant research scientist at CALCE. He holds a Ph.D. in Materials Science and Engineering from Carnegie Mellon University, a Masters degree in Metallurgical Engineering and Materials Science from Carnegie Mellon, and a Bachelors degree in Chemical Engineering from Princeton University.

His current research interests include failure mechanisms in electronic components and assemblies and effects of solder joint degradation on reliability of RF electronic products. Dr. Azarian has been leading CALCE's efforts in developing a methodology for reliability capability assessment of electronics manufacturers and suppliers. He has been an invited conference speaker on nano-tribology, and guest instructor and lecturer on reliability and tribology to both industry and academia. His technical publications include papers on electrochemical migration, capacitor reliability, advanced packaging, sensor technology, tribology, and colloid science. He also holds 5 U.S. patents for inventions in data storage and contamination control.

Prior to joining CALCE in 2004 he spent over 13 years in the data storage, advanced materials, and fiber optics industries, having worked for Philips Research Laboratories in Eindhoven, the Netherlands, W. L. Gore & Associates, and several start-up companies. He was most recently Manager of Quality and Reliability at Bookham Technology where he was responsible for qualification of optoelectronic products for telecommunications applications.

Recent Publications

Effects of Moisture and Temperature on Membrane Switches Laptop Keyboards , Jose Romero, Michael H. Azarian, Carlos Morillo, and Michael G. Pecht, IEEE Transactions on Device and Materials Reliability, August, 2018, DOI: 10.1109/TDMR.2018.2866776.

Failure of Polymer Aluminum Electrolytic Capacitors Under Elevated Temperature Humidity Environments, Anshul, Shrivastava, Michael Azarian, and Michael Pecht, IEEE Transactions on Components, Packaging, and Manufacturing Technology, 2017.

Thermal degradation of Polyimide Insulation and Its Effect on Electromagnetic Coil Impedance, N. Jordan Jameson, Michael H. Azarian, and Michael Pecht, Proceedings of the Society for Machinery Failure Prevention Technology Conference, May 15-18, 2017, Virginia Beach, VA.

Fault Detection in Bearings Using Autocorrelation, Rushit N. Shah, Michael H. Azarian, Michael G. Pecht, Proceedings of the Society for Machinery Failure Prevention Technology Conference, May 15-18, 2017, Virginia Beach, VA.

Rapid Assessment Testing of Polymer Aluminum Electrolytic Capacitors in Elevated Temperature-Humidity Environments, Anshul Shrivastava, Michael Azarian, and Michael Pecht, Journal of Failure Analysis and Prevention, Volume 16, Issue 6, 1059-1066, November, 2016, DOI: 10.1007/s11668-016-0184-0.

Motor bearing fault detection using spectral kurtosis-based feature extraction coupled with k-nearest neighbor distance analysis, Jing Tian, Carlos Morillo, Michael H. Azarian, Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 63, No. 3, 1793-1803, March 2016.


Upcoming Travel: Conferences, Events, and Guest Lectures
Event and Location Date
IEEE International Conference on Prognostics and Health Management, San Francisco June 17 - 19, 2019
Four-Day Failure Analysis of Electronics Short Course November 19 - 22, 2019