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Technical Program

Contact Diganta Das (diganta@umd.edu) for more information.

 

 

► All times are U.S. Eastern

Tuesday, June 23

 

Session 1: Opening Session – Policy and Data

Moderator: Dr. Diganta Das, PhD, University of Maryland

7:30 am

Registration

 

8:00 am

Opening Remarks

Tanya Martin (Executive Director, SMTA)

8:10 am

Twenty Years of Securing Supply Chain – SMTA/CALCE Symposium

Diganta Das, PhD, University of Maryland, Program Chair

8:45 am

Keynote Talk: Investing in a Robust Semiconductor Ecosystem: The UMD Story

Ankur Srivastava, PhD, University of Maryland

9:30 am

Break – Visit with Sponsors and Networking

 

 

Session 2: Are Trusted Sources Going to Help Technology Development and Counterfeit Reduction

Moderator: Cameron Shearon, Raytheon

10:00 am

“The Numbers Crunch” Counterfeit Reporting Trends 2025

Richard Smith, ERAI

10:30 am

Expanding Trusted Microelectronics: Meeting Future Needs

David Chesebrough, Defined Business Solutions

11:00 am

Design for Sourcing: a Method to Secure Your Supply Chain

Ed Dodd, Cofactr

11:45 pm

Lunch Break – Visit with Sponsors and Networking

 

 

Session 3: Technology Tools for Avoidance

Moderator: Nicholas Williams, PhD, SMT Corp.

1:00 pm

AI for Provenance and Traceability: Countering Counterfeit Risk in Semiconductor Supply Chains

Jeremy Muldavin, PhD, Cadence

1:30 pm

AI Enhanced Physical Inspection for Counterfeit Microelectronics

Charles Woychik, PhD, NHanced Semiconductors

2:00 pm

A Novel Anti-Counterfeiting Technology for Semiconductor Supply Chains Using Inkjet-Printed Silicon Nanoparticle Ink

Tadatomo Yamada, LINTEC Corporation

2:30 pm

Break – Visit with Sponsors and Networking

 

 

Session 4: Standards

Moderator: Kevin Sink, TTI

3:00 pm

SAE G19 and G21 Standards Status

Jim Creiman, SAE

3:45 pm

An Overview of the Revision of SAE AS6171: Standard for Detection of Counterfeit EEE Parts

Michael Azarian, PhD, CALCE, University of Maryland

4:15 pm

An Introduction to the SAE Online Tool for AS6171 Test Set Selection

Michael Azarian, PhD, CALCE, University of Maryland

4:45 pm

Adjourn

 

5:15 pm

Evening Reception

 

 

 

Wednesday, June 24

7:30 am

Registration

 

 

Session 5: Standards and Implementation

Moderator: Scott McKee, 4 Star Electronics

8:00 am

Anti-Counterfeit Aerospace Standards for non-EEE Materiel

Jim Creiman, SAE

8:30 am

Traceability: from Components to Assembly and Product - Industry Standards

Cameron Shearon, Raytheon

9:15 am

Analyze the Risk. Prove the Part. A Unified Counterfeit Mitigation Strategy

Lam Nguyen, CEO and Founder, chipsID LLC

9:45 am

Break – Visit with Sponsors and Networking

 

 

Session 6: Detection Cases

Moderator: Anthony Mestre, Micross

10:15 am

Inside Commercial AA & AAA Batteries: Structural and Electrical Variability Revealed by X-Ray and Discharge Testing

Morgan Stanul, MuAnalysis

10:45 am

Advanced Detection Techniques for Counterfeit Electronic Components

Nicholas Williams, PhD, SMT Corp.

11:15 am

A Telemetry-Guided DDR/GDDR Integration Testing and Data-Driven Diagnosis

Xu Cong, Global Electronic Test Services

11:45 pm

Lunch Break – Visit with Sponsors and Networking

 

 

Session 7: Standards and Laboratory

Moderator: Dr. Diganta Das

1:00 pm

Panel Discussion on Implementation of Standards and Laboratories

 

2:00 pm

Break – Visit with Sponsors and Networking

 

 

Session 8:

Moderator: Dr. Diganta Das, PhD, University of Maryland

2:30 pm

Unmasking the True Cost of Counterfeit Electronics: From Detection to System-Level Consequences

Paula George (Retired DLA) with Dan Dimase and Steve Walters (Aerocyonics, Inc.)

3:00 pm

Evaluating Risk When Evidence Diverges: A Counterfeit Case Study

Dane Reynolds, Astute Electronics Inc.

3:30 pm

Panel: The Return to an Era of Allocation of Components and Long Lead Times

Moderator: Kevin Sink, TTI

4:30 pm

Learnings from this year's event

Members of the Technical Committee

 

Thursday, June 25: Professional Development Courses

9:00 am –
12:30 pm

Electronic Part Obsolescence Forecasting, Mitigation, and Management

Prof. Peter Sandborn, PhD, University of Maryland

1:30 pm –
5:00 pm

Understanding and Implementing Industry Standards for Counterfeit Avoidance

Diganta Das, PhD, University of Maryland

9:00 am –
5:00 pm

Counterfeit Parts Detection Using SAE AS6171: Impact of the 2026 Updates

Michael Azarian, PhD, CALCE, University of Maryland

 

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das

Kristin Nafstad

For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Kristin Nafstad.


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