Advanced Detection Techniques for Counterfeit Electronic Components

Nicholas Williams [SMT Corporation]

Abstract: 

The baseline moderate risk testing requirements in AS6171 can be traced back to legacy counterfeit mitigation testing methods as defined in IDEA-1010 and AS6081. However, AS6171 moderate risk testing is becoming outpaced by increasingly complex counterfeit EEE (Electrical, Electronic, and Electromechanical) components. As counterfeiters now have access to semiconductor fabrication technology, they can produce more sophisticated and subtle counterfeits that are more difficult to detect using traditional testing approaches. Visual inspection techniques, even advanced visual inspection, are no longer sufficient for the mitigation of counterfeit EEE parts.
AS6171 provides a framework to detect complex counterfeit EEE components using advanced test methods specified for high and critical risk tiers. Increasingly, top A&D companies are requiring the adoption of these test methods for EEE parts sourced without traceability. These test methods include, but are not limited to, enhanced electrical testing (key electrical parameters from maximum to minimum operating temperature, burn-in, and temperature cycling), RAMAN/FTIR spectroscopy, Acoustic Microscopy, and 3D radiographical inspection, which provide insights into unique characteristics of counterfeits, especially cloned devices. This presentation will include several case studies covering the mitigation of complex counterfeit EEE parts threats using the advanced counterfeit detection testing methods specified in AS6171.

Biography: 

Dr. Nicholas Williams is the Lab Director at SMT Corporation. He received his B.S. in Electrical Engineering from the University of Connecticut in 2010 and his PhD in Electrical Engineering from the University of Connecticut in 2016. He started at SMT Corp in June of 2016 as a Senior Electrical Engineer, later becoming the Electrical Test Lab Manager in October of 2019. As the Lab Director, Dr. Williams is responsible for overseeing all testing in SMT's authentication and electrical testing labs.