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Technical Program

Contact Diganta Das (diganta@umd.edu) for more information.

 

 

► All times are U.S. Eastern

Tuesday, June 23

 

Session 1: Opening Session – Policy and Data

Moderator: Dr. Diganta Das, Ph.D., University of Maryland

7:30 am

Registration

 

8:00 am

Opening Remarks

Tanya Martin (Executive Director, SMTA)

8:10 am

Twenty Years of Securing Supply Chain – SMTA/CALCE Symposium

Diganta Das, PhD, University of Maryland, Program Chair

8:45 am

Keynote Talk: Status of CHIPs Funding to Promote Onshore Production

To be announced

9:15 am

2025 Data Crunch – What’s New

Richard Smith, ERAI

10:00 am

Break – Visit with Sponsors and Networking

 

 

Session 2: Are Trusted Sources Going to Help Technology Development and Counterfeit Reduction

Moderator: Cameron Shearon, Raytheon

10:30 am

Talk from Major Prime Contractor

To be announced

11:00 am

Expanding Trusted Microelectronics: Meeting Future Needs

David Chesebrough, Defined Business Solutions

11:30 am

To Be Announced

 

12:00 pm

Lunch Break – Visit with Sponsors and Networking 

 

 

Session 3: Technology tools for avoidance

Moderator: Steve Martell, Retired Nordson

1:00 pm

AI for Provenance and Traceability: Countering Counterfeit Risk in Semiconductor Supply Chains

Jeremy Muldavin, PhD, Cadence

1:30 pm

From Compliance Checklists to Cryptographic Evidence: Using Trusted Computing to Reduce Counterfeit Risk Across the Supply Chain

Thorsten Stremlau, NVIDIA, on behalf of the Trusted Computing Group

2:00 pm

A Novel Anti-Counterfeiting Technology for Semiconductor Supply Chains Using Inkjet-Printed Silicon Nanoparticle Ink

Tadatomo Yamada, LINTEC Corporation

2:30 pm

Break – Visit with Sponsors and Networking 

 

 

Session 4: Standards

Moderator: Kevin Sink, TTI

3:00 pm

SAE G19 and G21 Standards Status[DD1] 

Jim Creiman, SAE

3:30 pm

SAE Standard Laboratory Test Methods for Counterfeit Detection - 2026 Status

Michael Azarian, Ph.D., CALCE, University of Maryland

4:00 pm

New CDC Tool for Test Set Development

To be announced

4:30 pm

Unmasking the True Cost of Counterfeit Electronics: From Detection to System-Level Consequences

Paula George (Retired DLA) with Dan Dimase and Steve Walters (Aerocyonics, Inc.)

5:00 pm

Adjourn

 

6:30 pm

Evening Reception

 

 
 

Wednesday, June 24

7:30 am

Registration

 

 

Session 5: Standards and Implementation

Moderator: Anne Poncheri

8:00 am

Anti-Counterfeit Aerospace Standards for non-EEE Materiel

Jim Creiman, SAE

8:30 am

Test Labs and Standards Related Panel

 

9:30 am

Predict the Risk. Prove the Part. A Unified Counterfeit Mitigation Strategy

Lam Nguyen, CEO and Founder, chipsID LLC

10:00 am

Break – Visit with Sponsors and Networking

 

 

Session 6: Detection Cased

Moderator: Anthony Mestre, Micross

10:30 am

Inside Commercial AA & AAA Batteries: Structural and Electrical Variability Revealed by X-Ray and Discharge Testing

Morgan Stanul, MuAnalysis

11:00 am

Advanced Detection Techniques for Counterfeit Electronic Components

Nicholas Williams, PhD, SMT Corp.

11:30 am

A Telemetry-Guided DDR/GDDR Integration Testing and Data-Driven Diagnosis

Cong Xu, Global Electronic Test Services

12:00 pm

Lunch Break – Visit with Sponsors and Networking

 

 

Session 7: Machine Learning and AI Applications in Detection

Moderator: Sultan Lilani, Lilani Consulting Group

1:00 pm

AI Enhanced Physical Inspection for Counterfeit Microelectronics

Charles Woychik, PhD, NHanced Semiconductors

1:30 pm

To Be Announced

To Be Announced

2:00 pm

Break – Visit with Sponsors and Networking

 

 

Session 8: Taking Stock

Moderator: Dr. Diganta Das, Ph.D., University of Maryland

2:45 pm

Evaluating Risk When Evidence Diverges: A Counterfeit Case Study

Michael Flores, Astute Electronics Inc.

3:15 pm

Panel: Return to an era of allocation of components with long lead times, with high-level executives from the distribution industry

 

4:15 pm

Closing Panel

 

4:45 pm

Adjourn

 

 

 

Thursday, June 25: Professional Development Courses

9:00 am – 12:30 pm

Electronic Part Obsolescence Forecasting, Mitigation, and Management

Prof. Peter Sandborn, PhD, University of Maryland

1:30 pm – 5:00 pm

Understanding and Implementing Industry Standards for Counterfeit Avoidance

Diganta Das, PhD, University of Maryland

9:00 am – 5:00 pm

How to Make the Best Use of 2026 Updates to SAE AS6171

Michael Azarian, PhD, CALCE, University of Maryland

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das

Kristin Nafstad

For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Kristin Nafstad.


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