Contact: Diganta Das (diganta@umd.edu) for more information.

 
    ► All times shown are in US Eastern Time Zone
Tuesday, June 25
7:30 am Registration  
  Session 1: Opening Session Moderator: Diganta Das, Ph.D., University of Maryland
8:15 am Opening Remarks Diganta Das, Ph.D. (Program Chair) and Tanya Martin (Executive Director, SMTA)
8:30 am Keynote Address 1: Securing Our Future - Combating Counterfeit Semiconductors with Trusted Manufacturing Demand Ezra Hall, GlobalFoundries
9:30 am "The Numbers Crunch" Counterfeit Reporting Trends 2023 Richard Smith, ERAI
10:00 am Break – Visit with Exhibitors and Sponsors  
  Session 2: Broader View of the Supply Chain Moderator: Sultan Lilani, Integra Technologies
10:30 am Managing Counterfeit Risk Through the Use of Trusted Suppliers David Chesebrough, Defined Business Solutions
11:00 am Enhancing a Software Bill of Materials or Hardware Bill of Materials Leveraging Trusted Computing Group Standards and Principles Joshua Schiffman, HP Inc.
11:30 am Market Preference for Provenance and Traceability tied to Critical Infrastructure: US-EU initiative Jeremy Muldavin, Aerocyonics
12:00 pm Lunch Break – Visit with Sponsors and Networking    
  Session 3: Standards and Examples Moderator: Anne Poncheri, InterCEPT
1:00 pm Blockchain for Supply Chain Efficacy on Counterfeit Part Avoidance Hirbod Akhavantaheri, CALCE, University of Maryland
1:20 pm Status of SAE’s Counterfeit-Related Standards Jim Creiman, SAE G-19
1:50 pm Detection of Counterfeits Beyond Components - Examples and Challenges Diganta Das, Ph.D., CALCE, University of Maryland
2:10 pm Supplier Management for Purchases from Independent Distribution Anne Poncheri, InterCEPT
2:40 pm Break – Visit with Sponsors and Networking   
  Session 4: Testing and Accreditation Moderator: Diganta Das, Ph.D., CALCE, University of Maryland
3:00 pm SAE Standard Laboratory Test Methods for Counterfeit Detection - 2024 Status Michael Azarian, Ph.D., CALCE, University of Maryland
3:30 pm Accreditation to ISO/IEC 17025 and AS6171: A General Overview Travis Johnson, ANAB
4:00 pm Test Laboratory Panel Discussion: AS6171 Adoption and Accreditation Moderator: Dr. Diganta Das (CALCE, University of Maryland)
Panelists will include Travis Johnson (ANAB), Dr. Michael Azarian (CALCE, University of Maryland), Anne Poncheri (InterCEPT), Sultan Lilani (Integra Technologies), and Dan Tang (Global ETS)
5:15 pm Adjourn  
5:15 pm Evening Reception  

 

Wednesday, June 26
7:30 am Registration  
  Session 5: Law and Policy Moderator: Kevin Sink, TTI, Inc
8:30 am Keynote Address 2: Microelectronics Acquisition Policy of the US Government

Michael Fritze, Ph.D., Potomac Institute for Policy Studies

9:30 am Debugging the Trademark Laws: Civil and Criminal Liability for Trafficking in Counterfeit Microelectronics Patricia E. Campbell, J.D., LL.M., Professor, University of Maryland Carey School of Law
10:00 am Break – Visit with Sponsors and Networking  
  Session 6: Aspects of Sources and Detection Moderator: Diganta Das, Ph.D., CALCE, University of Maryland
10:30 am The Evolution of the Counterfeit Electronic Parts Threat Michael Schwarm and Jason Romano, SMT Corporation
11:00 am Quality and Safety Issues of Counterfeit Lithium-Ion Batteries Masoud Rostami-Angas, Ansys
11:30 am Side Channel Assessment of Components for Authenticity Evaluation and Beyond Devon Richman, CALCE, University of Maryland
12:00 pm Lunch Break – Visit with Sponsors and Networking   
 
Session 7: Machine Learning and AI Applications
Moderator: Cameron Shearon, Raytheon Missiles & Defense
1:00 pm Evaluating Electronic Component Testing with AI-Based Test Augmentation Charlie Polidoro, PCX
1:30 pm Counterfeit IC Detection Using RF Excited Signals and AI-Assisted Classifications Jack Chuang, Ph.D. and David Griffith, Ph.D., NIST
2:00 pm Magnetic Current Imaging Using the Quantum Diamond Microscope David Glenn, EuQlid
2:30 pm Break – Visit with Sponsors and Networking  
 
Session 8: Closing Session
Moderator: Diganta Das, Ph.D., University of Maryland
3:00 pm Back-to-Basic but Hard-to-Detect Visual Methodology to Identify Counterfeit Parts Krishna Ganason, Fusion Worldwide
3:30 am Tackling Modern Day Obsolescence and Counterfeit Problem Sultan Lilani, Integra Technologies
4:00 pm Learnings from the event and path forward Members of the Technical Committee
4:45 pm Adjourn  

 

 


Program Presented by

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das.

Karlie Severinson

For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Karlie Severinson.


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