Counterfeit IC Detection Using RF Excited Signals
and AI-Assisted Classifications

Jack Chuang and David Griffith [NIST]

Jack Chuang received the Ph.D. degree from The Pennsylvania State University, State College, PA, USA, in 2008. He was a Graduate Research Assistant with the Communications and Space Sciences Laboratory, The Pennsylvania State University. He then worked with BAE Systems, Merrimack, NH, USA, in electronic warfare and Cisco Systems, Richfield, OH, USA, in spectrum sharing. He is currently with Communication Technology Laboratory, NIST, Gaithersburg, MD, USA, developing 5G mmWave channel sounders.

David Griffith has an extensive background in engineering and management, spanning over 24 years. He currently leads a team at the National Institute of Standards and Technology (NIST), focusing on research in channel measurement and modeling at millimeter wave frequencies. Prior to his current role, he served in various positions at NIST, including as a Rotating Program Analyst and a Supervisory Electronics Engineer. David's research interests include advanced optical networks, wireless communications for smart grids, and public safety communications networks. Before joining NIST, he worked as a Senior Engineer at Raytheon Technologies.

Presentation Abstract

Counterfeit semiconductor devices are a major economic and security threat that can cause losses in multiple economic sectors. This problem's impact on national security is serious and growing because every part of the country, such as the military, utilities, businesses, and individuals, relies on complex and highly integrated circuits and systems. In 2019, the Organization for Economic Co-operation and Development (OECD) estimated that the global trade of pirated IC products is $500 billion. Systems that detect counterfeit ICs, such as those that use X-ray microscopy, are challenging to deploy. Using RF signatures to detect counterfeit IC detection requires precise setups, advanced signal processing techniques, EM modeling, and a wide frequency range of operation (MHz to mmWave). This talk will discuss measurement and analysis techniques based on excited and reflected RF signals from ICs under test that contain non-linear and non-deterministic signal behaviors.

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das.