Magnetic Current Imaging Using the Quantum Diamond Microscope



Date and Time: June 26 - 2:00 pm
 

David Glenn [EuQlid]

David Glenn is the CTO of EuQlid, an early-stage startup company that builds diamond-based magnetic field sensors for integrated circuit failure analysis and hardware security. Dr. Glenn has over 10 years experience developing novel quantum sensing technologies, with applications including super-resolution microscopy, ultrasensitive NMR spectroscopy, and medical diagnostics. He holds a Ph.D. in atomic physics from Yale University.

Presentation Abstract


EuQlid is building a sensitive, versatile, and robust magnetic field imaging system for current mapping in integrated circuits and electronic devices. Magnetic fields readily penetrate most materials, including semiconductors, metallic power or ground planes, and packaging compounds. Magnetic imaging therefore provides opportunities for noninvasive inspection of circuit activity, which may be a valuable resource for verifying provenance and correct functioning of electronic systems. The EuQlid platform, based on the quantum diamond microscope (QDM), can image all components of the vector magnetic field simultaneously, providing superior 3D current reconstruction in both intact and decapsulated devices. The instrument can be operated in two modes: (i) a parallel-imaging mode, where magnetic field maps are simultaneously acquired over a ~20 mm^2 field of view (FOV) with spatial resolution down to <1 μm, for high throughput and high spatial resolution; or (ii) a scanned single-pixel mode that trades off reduced spatial resolution for enhanced sensitivity and increased imaging area. Alternating between modes requires minimal reconfiguration, enabling a seamless workflow for zooming in progressively on magnetic features of interest, from board-level, to components, to package- or die-level current monitoring. In this talk, we will introduce the underlying technology, summarize initial academic demonstrations in failure analysis and hardware security, and hypothesize about potential future applications to counterfeit detection.

 

 

 

Dr. Diganta Das

For more information about the Technical Program and Professional Development Courses, please contact Dr. Diganta Das, Conference Chair, CALCE.

Karlie Severinson

For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Karlie Severinson.


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