Technical Program

 

Contact: Diganta Das (diganta@umd.edu) for more information.

 

   

► All times shown are in BST - British Summer Time

Tuesday, April 15
10:00 am Registration and Networking  
  Session 1: Cause and Effect Moderator: Diganta Das
10:30 am

Introduction to the Organizers and the Event

Diganta Das, Ian Blackman, and Roger Rogowski
10:45 am Keynote Talk: The Intersection of Obsolescence and Counterfeiting Daniel Grundy, Jaguar Land Rover
11:30 am 2024 Numbers Crunch Richard Smith, ERAI, Inc
12:15 pm Lunch  
1:00 pm Wimbledon Stadium Tour  
  Session 2: Risks to the System Moderator: Giovanna Mura
2:30 pm Industry Talks  
3:00 pm License to Bridge the Gap: The Semiconductor Vs Program Lifecycle Delta Luke Fitzpatrick, Rochester Electronics
3:30 pm Reporting and Sharing Information on Counterfeit Cases Roger Rogowski and Ian Blackman, Anticounterfeiting Forum
4:30 pm Secure Electronics Manufacturing for Counterfeit Detection and Tampering Prevention Sean Bouskila and Eyal Weiss, Cybord
5:00 pm Social Gathering Time and Place to be Announced at the Event

 

Wednesday, April 16
  Session 3: Policies and Implications Moderator: Roger Rogowski
8:30 am Keynote Talk: Intellectual Property Laws in the UK and their Enforcement Strategies Miles Rees, Deputy Director, Enforcement Intellectual Property Office
9:15 am Sustainable and Strategic Design to Combat Component Unavailability Rob Picken, Sourceability 
9:45 am Break  
  Session 4: Market Status and European Standards Moderator: Ian Blackman
10:00 am Update on International Counterfeit Standards Jo Vann, GE Aviation
10:30 am Securing Supply Chains and Advancing Sustainability: A Comprehensive Look at Retronix Component Preparation Services Rob Ronan, Retronix
11:00 am Counterfeit and Clone Component Fingerprinting Using RAMAN and FTIR Spectroscopy Nick Williams, SMT Corp.
11:30 pm Lunch Break  
  Session 5: Workshop  
12:30 pm Use of Component Documentation for Counterfeit Detection Diganta Das, CALCE, University of Maryland
1:45 pm Break  
  Session 6: SAE Standards Moderator: Stuart Saunders
2:00 pm An Overview of the SAE Standards Related to Counterfeit Diganta Das, CALCE, University of Maryland
2:45 pm Accreditation to ISO/IEC 17025 and AS6171: A General Overview Travis Johnson, ANAB
3:15 pm Break – Visit with Sponsors and Networking  
  Session 7: Technical Topics Moderator: Diganta Das
3:30 pm Geo-Political Impacts on Counterfeit Risk     Ian Blackman, Anticounterfeiting Forum
4:00 pm Closing Panel Discussion - Lessons Learned Committee Members
4:30 pm Adjourn  

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