Counterfeit and Clone Component Fingerprinting Using RAMAN and FTIR Spectroscopy

Nick Williams [SMT Corp.]

Abstract: 

As counterfeit electronic components, including cloned counterfeits, become increasingly complex and more difficult to detect, there is considerable momentum in moving from the standard, moderate-risk AS6171 testing to high-risk level AS6171 testing. Along with expanded electrical testing and advanced radiographical imaging, RAMAN and Fourier Transform Infrared (FTIR) spectroscopy are the primary techniques (in addition to the requirements of moderate risk testing) that can reach the 80% counterfeit detection coverage (CDC) threshold for high risk AS6171 testing.  RAMAN and FTIR spectroscopy both utilize light sources for exciting/vibrating the molecules of materials, creating spectra based upon absorption from an infrared source (FTIR) or reflection from a monochromatic laser (RAMAN). The resulting FTIR and RAMAN spectra, or “fingerprint”, have unique peaks associated with the various chemical compounds comprising the material being analyzed. In the case of electronic components, the FTIR and RAMAN spectra contain information about the encapsulation and marking material along with any other surface chemistry such as coatings and contaminants. Qualitative assessment of the spectra against a database of material compounds and/or known good samples allows for a straightforward Pass/Fail designation.

Utilizing a comprehensive database of “fingerprints”, counterfeit electronic components can quickly and efficiently be identified with a high degree of accuracy in timeframes significantly faster than scanning electron microscopy, resurfacing/remarking tests, and decapsulation/die microscopy. This presentation will focus on efforts to develop a comprehensive library of components to support the “fingerprinting” of authentic, clone, and counterfeit components with discussion on various trends, observations, and case studies.

Biography: 

Dr. Nicholas Williams is the Lab Director at SMT Corporation. He received his B.S. in Electrical Engineering from the University of Connecticut in 2010 and his PhD in Electrical Engineering from the University of Connecticut in 2016. He started at SMT Corp in June of 2016 as a Senior Electrical Engineer, later becoming the Electrical Test Lab Manager in October of 2019. As the Lab Director, Dr. Williams is responsible for overseeing all testing in SMT's authentication and electrical testing labs.