Technical Program
Contact: Diganta Das (diganta@umd.edu) for more information.
| ► All times shown are in US Eastern Time Zone | ||
| Tuesday, June 27 | ||
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Session 1: Counterfeiting - the Current State of Play
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Moderator: Diganta Das, Ph.D., University of Maryland | |
| 7:30 am | Registration | |
| 8:15 am | Opening Remarks | Diganta Das, Ph.D., and Tanya Martin, Executive Director, SMTA |
| 8:30 am | Keynote Speech: Commercial Electronics in NASA Missions – Many Benefits, But What About the Risks? | Peter Majewicz, Ph.D., Goddard Space Flight Center - NASA |
| 9:15 am | "The Numbers Crunch” Counterfeit Reporting Trends 2022 | Richard Smith, ERAI, Inc |
| 10:00 am | Break – Visit with Sponsors and Networking | |
| Session 2: Broad View of the Supply Chain | Moderator: Kevin Sink, TTI, Inc. | |
| 10:30 am | Leveraging Supply Chain Trust with TCG Standards and Principles |
Thorsten Stremlau, NVidia |
| 11:00 am | Template for a Practical Provenance and Sustainability Ecosystem |
Michael Ford, Aegis Software |
| 11:30 am | Modeling to Analyze the Impact of Blockchain on Counterfeit Part Avoidance | Hirbod Akhavantaheri, CALCE, UMD |
| 12:00 pm | Lunch Break – Visit with Sponsors and Networking | |
| Session 3: Standards | Moderator: Cameron Shearon, Raytheon | |
| 1:00 pm | A New Counterfeit Avoidance Standard for Independent Distribution | Jim Creiman, Northrop Grumman |
| 1:30 pm | Standards-Based Detection of Counterfeit Electronic Parts: An Update on SAE AS6171 | Michael Azarian, Ph.D, CALCE, UMD |
| 2:15 pm | A Introduction to the Upcoming IDEA-STD-1010-C | Faiza Khan, IDEA |
| 2:45 pm | Break – Visit with Sponsors and Networking | |
| Session 4: Aspects of Detection | Moderator: Sultan Lilani, Integra Technologies | |
| 3:15 pm |
Joint Question and Answer Session: Jim Creiman (Northrop Grumman), Michael Azarian (CALCE, UMD), Faiza Khan (IDEA) and Kevin Sink (TTI Corp) |
Joining in Q & A: Diganta Das, CALCE, UMD, and Jerry Martinez, Jet Propulsion Laboratory |
| 3:45 pm | Surface Topography Analysis for the Detection of Counterfeit Microelectronic Parts | Devon Richman, CALCE, UMD |
| 4:15 pm | Research on Semiconductor Chip Grade Classification and Real-Time Evaluation Method Based on Hybrid Artificial Intelligence Technology | Cong Xu, Global ETS |
| 4:45 pm | Adjourn | |
