Destructive Evaluation (using relevant techniques) is performed after non-destructive evaluations are completed.  Destructive evaluation requires careful planning, as material will be altered in this step.  As much information as non-destructive evaluation (NDE) provides, destructive evaluation is often necessary to verify the failure mechanism and root cause.

Two initial techniques in destructive evaluation or electronic products are decapsulation/delidding and microsectioning

Chemical decapsulation consists of dissolving the plastic encapsulant using fuming nitric or sulfuric acid and delidding involves mechanically removing the lid from a hermetic package. Both decapsulation or delidding allow for internal examination of the die and interconnects by opticalelectronmagnetic, or emission microscopy. Additional destructive evaluation can also be performed, using either focused ion beam imaging or transmission electron microscopy. These techniques permit detection of bond pad corrosion, passivation cracking, ball bond lifting, stress-driven diffusive voiding, electromigration, metallization corrosion, and other failure mechanisms at the die level.

Microsectioning, also known as cross-sectioning, is performed to reach a surface which reveals an important feature of the sample, such as intermetallic formation in wire bonds or delamination at the fiber/epoxy interface in printed circuit boards. The cross-sectioned surface is often examined using optical microscopy, electron microscopy, and energy dispersive spectroscopy.

Mechanical testing, FTIR, contact resistance, and popcorn assessment.

Destructive evaluation methods:

*These techniques are also performed during Non-Destructive Evaluation


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