► All times are U.S. Eastern 

Tuesday, June 24

Session 1: Opening Session

Moderator: Dr. Diganta Das, Ph.D., University of Maryland

7:30 am

Registration

8:15 am

Opening Remarks

Dr. Diganta Das (Program Chair) and Tanya Martin (Executive Director, SMTA)

8:30 am

Keynote talk: Microelectronics Powering America's Defense

Matthew Hicks, Northrop Grumman

9:15 am

Data Crunch - 2024

Richard Smith, ERAI

10:00 am

Break – Visit with Sponsors and Networking

Session 2: Trusted Sources

Moderator: Cameron Shearon

10:30 am

Reducing Counterfeit Risk Through the Use of DoD Trusted Suppliers

David Chesebrough, Defined Business Solutions

11:00 am

Panel Discussion on Reducing Counterfeit Risk Through the Use of DoD Trusted Suppliers

Sultan Lilani, Integra; Calvin Chu, Chip Scan; and Dave Lawson, Northrop Grumman

12:00 pm

Lunch Break – Visit with Sponsors and Networking 

Session 3: Technology

Moderator: Anthony Mestre

1:00 pm

How to Use Side-Channel Assessment to Detect Counterfeit Microelectronics

Devon Richman, University of Maryland

1:30 pm

Rapid, Non-Destructive Detection of Counterfeit Integrated Circuits Using a Microwave Resonant Cavity System

Dr. Aditya Nechiyil, ResCav LLC

2:00 pm

Counterfeit and Clone Component Fingerprinting Using RAMAN and FTIR Spectroscopy

John Kaminski, SMT

2:30 pm

Break – Visit with Sponsors and Networking 

Session 4: Testing and Accreditation

Moderator: Nicholas Williams

3:00 pm

SAE G19 and G21 Standards Status 

William Scofield, The Boeing Company, and Dr. Diganta Das, University of Maryland

3:30 pm

SAE Standard Laboratory Test Methods for Counterfeit Detection - 2025 Status

Dr. Michael Azarian, University of Maryland

4:00 pm

Test Laboratory Panel Discussion

Moderator: Dr. Diganta Das, University of Maryland
Panelists include Michael Azarian, Devon Richman, and Nicholas Williams

4:45 pm

Adjourn

Wednesday, June 25

7:30 am

Registration

Session 5: Global View

Moderator: Diganta Das

8:30 am

Keynote Talk: A Global View Versus a U.S. Focus on Outsourced Assembly and Test (OSAT) Facilities to Support Wafer-Level Packaging

Dr. Chuck Woychik, NHanced Semiconductors

9:15 am

Market Preference for Provenance and Traceability tied to Critical Infrastructure: US-EU initiative 

Dr. Jeremy Muldavain, Cadence Design Systems

9:45 am

Break – Visit with Sponsors and Networking

Session 6: Legal and Policy

Moderator: Kevin Sink

10:15 am

Criminal Penalties for Trafficking in Counterfeit Microelectronics

Prof. Patricia Campbell, University of Maryland Carey School of Law

11:00 am

Building trust with TCG Technologies: from Supply Chain to End of Life and Beyond

Dr. Joshua Schiffman, HP Inc

11:30 am

Impacts of Blockchain on Supply Chain for Avoiding Counterfeits of Obsolete Parts

Dr. Diganta Das, University of Maryland

12:00 pm

Lunch Break – Visit with Sponsors and Networking

Session 7: Independent Distributor Voice

Moderator: Anne Poncheri

1:00 pm

Panel Discussion on the State of the Industry from the Perspective of the Independent Distributors

Representatives from CTG, 4Star, and Michael Flores from Astute

2:00 pm

You’re Auditing Us Like a Manufacturer: Rethinking How to Evaluate Distributors in the Fight Against Counterfeits

Dane Reynolds, Astute Electronics Inc.

2:30 pm

Break – Visit with Sponsors and Networking

Session 8: Closing Session including Machine Learning Applications

Moderator: Dr. Diganta Das, Ph.D., University of Maryland

2:45 pm

Issues Related to Counterfeit Using Used / Aged Parts – Update of Study on Detection of Aged Parts

Sultan Lilani, Integra

3:15 pm

AI-Driven Secure Electronics Manufacturing: Detecting Counterfeit and Hardware Tampering

Dr. Eyal Weiss, Cybord

3:45 pm

Objective Visual Inspection Measurement Result in Counterfeit IC Detection Using AI and Computer Vision

Dr. Chih-Yun Pai and Tom Zheng , Global ETS

4:15 pm

Learnings from the event and path forward

Members of the Technical Committee

5:00 pm

Adjourn