How to Use Side-Channel Assessment to Detect Counterfeit Microelectronics

Devon Richman [CALCE,University of Maryland]

Abstract: 

Counterfeit parts are becoming more challenging to detect using current test methods because counterfeiters are becoming more sophisticated. Current test methods remain effective, but they are slow and not well-suited for newer breeds of counterfeits that are likely on the horizon. Side-channels are indirect sources of information that originate from a device and contain information about its physical state or function. Side-channel power modulation analysis (PMA) is a technique that builds on the foundation of the power spectrum analysis method developed by Sandia National Laboratories. The ability of PMA as a rapid nondestructive screening method for remarked, recycled, and cloned devices is demonstrated. The capabilities of commercial PMA systems are compared to laboratory benchtop setups, demonstrating the readiness of the methodology for broader adoption.

Biography: 

Mr. Devon Richman is a Ph.D. candidate at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland College Park. He received his bachelor’s degree in mechanical engineering from the University of Maryland in 2019 and his Masters in 2023. He is an active member of the SAE G-19A Test Laboratory Standards Development Committee and a technical expert for the ANSI National Accreditation Board for SAE AS6171. Mr. Richman’s primary research interests are the use of side-channel methods for assessing the reliability of microelectronic devices, detection of counterfeit microelectronics, and failure analysis of electronic systems. He has worked on the analysis of current standards-based counterfeit detection methods as well as side-channel and machine vision detection systems. He has done work, including failure analysis, for industry leaders including General Electric, Cummins, Amazon Web Services, and Microsoft.

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das.

Kristin Nafstad

For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Kristin Nafstad.