Event
CALCE Webinar - Rapid Detection and Quantification of Microelectronic Degradation
Tuesday, January 27, 2026
11:00 a.m.-12:00 p.m.
Zoom
https://web.calce.umd.edu/seminars/cws20260127.htm
Abstract
Researchers at CALCE are developing new applications for a test method called side-channel power analysis. CALCE's work pairs machine-learning-based data analytics with the advantages of side-channel analysis to enable rapid testing of electronic products, including both parts and assemblies.
Side-channels are indirect sources of information that originate from a device and contain information about its physical state or function. While side channels have been used in cryptography and security, their application in reliability and quality assessment has been limited. CALCE is pioneering cutting-edge research on this test method, which has great potential to quickly identify electronic products that deviate from acceptable quality and reliability standards. Testing is nondestructive and can be performed in a matter of seconds, potentially requiring connections only to power and ground terminations.
CALCE's partnership with Chiplytics, which is developing and manufacturing a commercial side-channel power analysis tool, means CALCE's research and findings can be readily implemented using affordable and commercially available equipment. In addition, CALCE has been collaborating with Chiplytics on an Air Force Research Laboratory STTR Phase 2 contract to develop applications of side-channel testing for the detection of counterfeit microelectronics.
In this webinar, we will explain the fundamental principles of side-channel power analysis and present the results of CALCE's research. Join us as we explore the full potential of this innovative test method and take advantage of the opportunity to learn about the latest developments in electronic testing.
Companies that produce or use electronic products need a rapid method to assess the quality and reliability of those products. The CALCE consortium is initiating a research workgroup to develop applications of a new test method, side-channel power analysis, for rapid testing of electronic products, including both parts and assemblies.
Side-channels are indirect sources of information that originate from a device and contain information about its physical state or function. While side channels have been used in cryptography and security, their potential for reliability and quality assessment remains unexplored. CALCE is pioneering cutting-edge research on this test method, which has great potential to quickly identify electronic products that deviate from acceptable quality and reliability standards. Testing is nondestructive and can be performed in a matter of seconds, potentially requiring connections only to power and ground terminations.
CALCE's partnership with Chiplytics, which is developing and manufacturing a commercial side-channel power analysis tool, means that the findings of this workgroup can be readily implemented using affordable and commercially available equipment.
In this webinar, we will explain the fundamental principles of side-channel power analysis, review CALCE's preliminary research, and demonstrate its wide range of applications for electronic product assessment. Join us as we explore the full potential of this innovative test method, take advantage of the opportunity to ask questions, and learn how to participate in the workgroup.
About the Presenters:
DEVON RICHMAN is a Ph.D. candidate at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland, College Park. He received his Bachelor's degree in Mechanical Engineering from the University of Maryland in 2019 and completed his Master's in Mechanical Engineering in 2023.
His primary research focuses on applications of side-channel analysis to microelectronics. He has conducted research and failure analysis for prominent industry leaders, including General Electric, Cummins, Microsoft, and Amazon. Additionally, he serves as the co-chair of the SAE G-19A risk assessment subcommittee, which is responsible for the AS6171/1 document on testing for counterfeit part detection.
Dr. MICHAEL H. AZARIAN is a Research Scientist at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland. He holds a Master's and Ph.D. in Materials Science and Engineering from Carnegie Mellon University and a Bachelor's degree in Chemical Engineering from Princeton University.
His research is focused on the analysis, detection, prediction, and prevention of failures in electronic and electromechanical products. He has over 150 publications on electronic packaging, component reliability, prognostics and health management, and tribology. He holds 6 U.S. patents. Before joining CALCE in 2004, he spent over 13 years in the data storage, advanced materials, and fiber optics industries.
Dr. Azarian is chairman of the SAE G-19A standards committee on detection of counterfeit parts, which is responsible for the AS6171 and AS6810 family of standards. He is also the chairman of the IEEE 1624 standards committee on organizational reliability capability.
