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The CALCE Battery Research Group features state-of-the-art shared instrumentation facilities that support high-level scientific research and student training. Each Facility offers multiple research instruments and high-end tools, needed to support the diverse research activities within the Department. These facilities welcome users from the many universities, companies and federal laboratories, providing hubs for collaboration and innovation.


Electrical Characterization

C8000

Cadex C8000 Battery Test System

3 channel, 1.2V - 36V, 10A charge and discharge per channel,100W per channel on charge; 80W on discharge

AG34970A

Agilent 34970A Data Acquisition

2-slot mainframe, 96 matrix crosspoints, Measures and converts 11 different input signals, 60 channels input

INL_I

Princeton Applied Research's VersaSTAT 3

Potentiostat/galvanostat with frequency response analyzer (FRA) 1 µHz to 1 MHz, Max Current: ±2A.

BTS4000

Neware BTS4000

3 channels, current control range of 0A to 3000A, voltage ranges of 0V to 110V, Accuracy of ∓0.05% FS

BT2000

Arbin BT2000 Battery Test System

15 channel battery tester, tests up to 5V per channel, 0.02 to 0.1% FSR control

BT_I

Arbin BT-I

15 channel battery tester, 1mA-10A, 10-20V per channel, 0.02 to 0.1% FSR control 

BTS4000

Olympus EPOCH XT Ultrasonic Pulser and Receiver

Pulse repetition frequency (PRF): 9 Hz to 1 kHz 5 megahertz, ¼” diameter ultrasonic transducer

Environmental Chambers

MBraun Globebox

MBRAUN Glove Box Workstation

A Stainless steel design with Inert gas purification system having Large antechamber with sliding tray and PLC-M

BTS4000

Yamato DVS 402

Laboratory Constant Temperature Ovens with temperature ranging from Room temp +4°C to 260°C with accuracy of ∓1.0°C

Temperature Humidity Chamber

Thermo Temperature Humidity Chamber

Incubator- Temperature range: Ambient +4° to 75°C. 120V/300W, True laminar airflow for tight temperature uniformity

Mechanical Testing

A range of equipment is available to measure electrical, thermal, mechanical, and material properties critical to the performance and reliability of systems. Specific equipment includes:

TA DMA

TA's Dynamic Mechanical Analyzer

Texas Instrument's Rheometrics Solids Analyzer,generates 0.0001N-18N Force with force resolution of 0.00001N, Deformation range: ∓0.5 to 10,000 pm, Temperature Range:-150 to 600°C

BTS4000

Data Physics 1D Electrodynamic Shaker

Max Sinusoidal Force- :468Kgf, Max Random Force:261Kgf, Max Shock Force:994Kgf, Frequency Range: 5- 3000Hz

Temperature Humidity Chamber

Perkin-Elmer Differential Scanning Calorimeter

Furnace: 19 to 600°C; Maximum scan rate: 500°C/min; Sensitivity:0.1µW, Uses Nitrogen as shield gas and Helium as purge gas

 

6D Electrodynamic Shaker

Vibrotron 6D-Electrodynamic Shaker

Peak force of 4200N for sinusoidal vibrations, 3400N RMS force for random vibrations and 7100N force for classic shock, Frequency range:5- 4500Hz

DAC

DAC Torsion Tester

ElectroMechanical Test Machine with Torque range of 1Nm to 5.5kNm with frequency range of 2Hz- 30Hz capable of performing static, dynamic and fatigue testing applications

MTS

Mechanical Test System

Axial and torsional actuators; Temperature Range: -129° to 540°C, Digital controllers with high channel density, high capacity and superior configurability

Failure Analysis

Extensive experience and state-of-the-art equipment are used for failure analysis of batteries, electronic components, printed circuit boards, connectors, products and systems.

Optical Microscope

Zeiss AxioCam MRc5 Optical Microscopy

4 Megapixel (2584 x1936) resolution, 12 bit / 12 Mhz pixel clock, 36-bit color depth, Dynamic range of 1:1300 for optimal

FTIR

Agilent Fourier Transform Infrared Spectroscopy

Multi-range FT-IR spectrometer capable of both rapid scan and step scan operation. Spectral range 10,000-400/cm.

AFM

Nikon Atomic Force Microscopy

2D topography measurement, vertical resolution typically 50 pm, characterization of the topography and electrical, chemical, magnetic and mechanical properties

XRF

Fischer X-ray Fluorescence Microscopy

Micro-focus tube, measurement chamber with a C-slot, 4-x aperture changer, 3 primary filters, Larger measuring distances possible (DCM, stroke 0-80 mm)

XRM

GE Phoenix Nanome X-ray Microscope

Combined 2D / 3D CT operation, Digital image chain and active temperature-stabilized digital detector with 30 fps, 180 kV / 15 W nanofocus tube, 200nm detail detectability

SEM EDS

Scanning Electron Microscopy/ Energy Dispersive Spectroscopy

2 modes: High vacuum, Low vacuum and ESEM, Resolution range: 0.8nm- 3nm, Accelerating voltage: 200V – 30kV, Digital video recording, Vacuum: 6e- 4000Pa

SAM

OKOS NDT CF-300 Scanning Acoustic Microscope

Digital Pulse Receiver, Optional second channel, Max velocity: 1499mm/s, Accuracy and repeatability: ∓0.5 micron

TMA

Thermo-mechanical Analyzer

Temperature Range: -151 to 1,000 °C, Precision: ∓1°C, Maximum Sample Size: 26mm x 1.0mm x 4.7mm, Measurement Precision: ∓0.1%

 


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