Policy Analysis Section of Counterfeit Microelectronics Study

Prof. Patricia E. Campbell

Produced under Contract Number: HQ0727-19-P0030

Section 843 Machine Vision Pilot Program Report Generation and Policy Analysis (MVP)

Principal Investigator: Dr. Michael H. AzarianCo-Principal Investigator: Dr. Diganta DasDMEA Project Engineer: Jeff Carlile

CALCE has released an excerpt from the final report produced for the Defense Microelectronics Activity (DMEA) in December 2020 for public access. “Machine Vision Pilot (MVP) Counterfeit Microelectronics Policy Analysis” was authored by Prof. Patricia E. Campbell of the University of Maryland Carey School of Law at the University of Maryland, Baltimore under a subcontract. In this report, a policy analysis was conducted to identify potential impediments to the effective implementation of existing laws and regulations and to indicate steps that can enhance the effective application of such rules, regulations, or processes, to mitigate counterfeit microelectronics proliferation throughout the US Department of Defense. It also identifies the policy considerations and recommended actions necessary for Machine Vision to be implemented in counterfeit detection and authentication of electronic parts.

To Access the Policy Analysis Report: Click Here

For more information about this policy analysis or counterfeit risk mitigation, please contact Dr. Michael H. Azarian and Dr. Diganta Das

Published March 1, 2023