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Impedance/Material Analyzers are designed to measure complex electrical impedance, capacitance, inductance, and resistance as a function of frequency. These tools are allow for evaluating electronic components, semiconductor devices, and dielectric/magnetic materials. These tools allows for high-speed testing, graphical sweep analysis, and material characterization (e.g., permittivity, permeability).
The Agilent E4991A RF impedance/material analyzer offers ultimate impedance measurement performance and powerful built in analysis function. The Agilent E4991A uses an RF-IV technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is +/-0.8%. High Q accuracy enables low-loss component analysis. The internal synthesizer sweeps frequency from 1 MHz to 3 GHz with 1 mHz resolution.
Material Evaluation
The Agilent E4991A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1 GHz).
On-Wafer Measurement
The E4991A-010, Probe Station Connection Kit, enables us to connect the Agilent E4991A to a RF probe system for making on-wafer impedance measurements.
Temperature Characteristic Evaluation
The temperature characteristic test kit, the E4991A-007, is a new solution of temperature characteristic measurement for components and materials. This option provides highly accurate temperature characteristic analysis capability within the wide temperature range from - 55 °C to + 150°C with a powerful temperature drift compensation function.
Features:
- Basic accuracy +/-0.8%
- 3GHz impedance direct read-out
- Windows-styled user interface
- Sweep parameters (frequency, ac level, dc bias)
- Built-in VBA programming function
- Various test fixture for components
- Data transfer through the LAN interface
- Direct read-out permittivity, permeability
- Reliable on-wafer measurement
- Temperature characteristic measurement
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