Safe Handling and Removal Procedures of EEE (ESD Sensitive) Parts from IC Packaging

Printed Wiring Assemblies (PWA) and Counterfeit Detection using Non-Destructive X-ray CT Analysis

Beyond Authorized Distribution: How to Vet Independent Distributors

AI Visual Detection of Defects and Corrosion on Leads in Electronic Components

Testing Method to Identify Counterfeit Field-Programmable Gate Arrays (FPGAs)

Embedded Digital RFID for Chip Asset Tracking

Traceability: Security & Privacy Are Not Mutually Exclusive

Lecture by Prof. Pecht: The Safety-Related Challenges of Using Li-Ion Batteries

SAE AS7124™ Industry Practice for the Government Industry Data Exchange Program (GIDEP)

Laser Focused Traceability of Microelectronics in the Supply Chain