Prognostics and Health Management of Electronics

Published in 2020

Deep Residual Shrinkage Networks for Fault Diagnosis, Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, and Michael Pecht; IEEE Transactions on Industrial Informatics, Vol. 16, Issue 7, July 2020, DOI: 10.1109/TII.2019.2943898.

Multiple Wavelet Regularized Deep Residual Networks for Fault Diagnosis, Minghang Zhao, Baoping Tang, Lei Deng, and Michael Pecht, Measurement, Vol. 152, February 2020, DOI: 10.1016/j.measurement.2019.107331.

Published in 2019

Fault Detection Isolation and Diagnosis of Multi-axle Speedsensors for High-speed Trains , Gang Niu, Liujing Xiong, Xiaoxiao Qin, and Michael Pecht, Mechanical Systems and Signal Processing, Vol. 131, pp. 183-198, September 15, 2019 DOI:10.1016/j.ymssp.2019.05.053.

A Maintenance and Troubleshooting Method Based on Integrated Information and System Principles , Yan Su, Xue Rui Liang, Hui Wang, Jin Jun Wang, and Michael Pecht, IEEE Access, Vol. 7, pp 70513-70524, May 7, 2019, DOI:10.1109/ACCESS.2019.2915327.

Lithium-ion Battery Health Prognosis Based on a Real Battery Management System Used in Electric Vehicles , Rui Xiong, Ju Wang, Hongwen He, Yongzhi Zhang, Michael G. Pecht, and Simin Peng, IEEE Transactions on Vehicular Technology, Vol. 68, No. 5., pp. 4110-4121, May 2019, doi: 10.1109/TVT.2018.2864688.

Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management, Jinwoo Lee, Daeil Kwon, and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 66, No. 9, pp. 7310-7315, 2019, DOI: 10.1109/TIE.2018.2880701.

Predicting Damage and Life Expectancy of Subsea Power Cables in Offshore Renewable Energy Applications , Fateme Dinmohammadi, David Flynn, Chris Bailey, Michael Pecht, Chunyan Yin, Pushpa Rajaguru, and Valentin Robu, IEEE Access, Vol. 7, No. 1, pp. 54658-54669, 2019, DOI: 10.1109/ACCESS.2019.2911260.

Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis, Du Wenliao, Myeongsu Kang, and Michael Pecht, IEEE Transactions on Industrial Electronics, Preprint, March 11, 2019, DOI:10.1109/TIE.2019.2892667.

Systems of Preventive Cardiological Monitoring: Models, Algorithms, First Results, and Perspectives , Sergey Kirillov, Aleksandr Kirillov, Vitalii Iakimkin, Michael Pecht, and Yuri Kaganovich, Medical Internet of Things (m-IoT)-Eneabling Technologies and Emerging Applications, February 27, 2019, DOI: 10.5772/intechopen.75921.

Multiple Wavelet Coefficients Fusion in Deep Residual Networks for Fault Diagnosis, Minghang Zhao, Myeongsu Kang, Baoping Tang, and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 66, No. 6, pp. 4696-4706, June 2019, DOI:10.1109/TIE.2018.2866050.

Validation and Verification of a Hybrid Method for Remaining Useful Life Prediction of Lithium-ion Batteries, YongZhi Zhang, Rui Xiong, HongWen He, and Michael Pecht, Journal of Cleaner Production, Vol. 212, pp. 240-249, 2019, DOI: 10.1016/j.jclepro.2018.12.041.

A Rotating Machinery Fault Diagnosis Method Based on Feature Learning of Thermal Images, Zhe Jia, Zhenbao Liu, Chin-Man Vong, and Michael Pecht, IEEE Access, Preprint, January 17, 2019, DOI: 10.1109/ACCESS.2019.2893331.

 

Published in 2018

Anomaly Detection During Lithium-ion Battery Qualification Testing, Saurabh Saxena, Myeongsu Kang, Yinjiao Xing, and Michael Pecht, 2018 IEEE International Conference on Prognostics and Health Management (ICPHM), 11-13 Jun, 2018, Seattle, WA, USA.

A Physics-Based Electrochemical Model for Lithium-Ion Battery State-of-Charge Estimation Solved by an Optimised Projection-Based Method and Moving-Window Filtering , Wei He, Michael Pecht, David Flynn, and Fateme Dinmohammadi, Energies, Vol. 11, No. 2120, pp. 1-23, 2018, DOI: 10.3390/en11082120.

Creating Self-aware Low-Voltage Electromagnetic Coils for Incipient Insulation Degradation Monitoring for Smart Manufacturing, Kai Wang, Haifeng Guo, Aidong Xu, Bingjun Yan, N. Jordan Jameson, and Michael G. Pecht, IEEE Access, Vol. 6, 69860-69868, DOI: 10.1109/ACCESS.2018.2880266.

Reliability Analysis of Repairable Systems Based on a Two-Segment Bathtub-Shaped Failure Intensity Function , Xuejiao Du, Zhaojun Yang, Chuanhai Chen, Xiaoxu Li, and Michael G. Pecht, IEEE Access, Vol. 6, PP. 52374 - 52384, 2018, DOI: 10.1109/ACCESS.2018.2869704.

Unsupervised Locality-Preserving Robust Latent Low-Rank Recovery-Based Subspace Clustering for Fault Diagnosis , Jie Gao, Lifeng Wu, Jing Tian, Myeongsu Kang, and Michael G. Pecht, IEEE Access, Vol. 6, PP. 52345 - 52354, 2018, DOI: 10.1109/ACCESS.2018.2869923.

Lithium-ion Battery Remaining Useful Life Prediction with Box-Cox Transformation and Monte Carlo Simulation , Yongzhi Zhang , Rui Xiong, Hongwen He, and Michael G. Pecht, IEEE Transactions on Industrial Electronics, Vol. 66, No. 2, pp. 1585-1597, 2019, DOI: 10.1109/TIE.2018.2808918.

Remaining Useful Life Prediction for Lithium-ion Batteries Based on an Integrated Health Indicator , Yongquan Sun, Xueling Hao, Michael Pecht, and Yapeng Zhou, Microelectronics Reliability, Vols. 88-90, 1189-1194, September 2018, doi: 10.1016/j.microrel.2018.07.047.

Multi-wavelet Coefficients Fusion in Deep Residual Networks for Fault Diagnosis , Minghang Zhao, Myeongsu Kang, Maoping Tang, and Michael Pecht, IEEE Transactions on Industrial Electronics, August, 2018, doi: 10.1109/TIE.2018.2866050.

Challenges and Research Issues of Data Management in IoT for Large-Scale Petrochemical Plants , Lei Shu, Mithun Mukherjee, Michael Pecht, Noel Crespi, and Son N. Han, IEEE Systems Journal, Vol. 12, No. 3, PP. 2509 - 2523, September, 2018, doi: 10.1109/JSYST.2017.2700268.

Fault Detection for Gas Turbine Hot Components Based on a Convolutional Neural Network , Jiao Liu, Jinfu Liu, Daren Yu, Myeongsu Kang, Weizhong Yan, Zhongqi Wang, and Michael G. Pecht, Energies, Vol. 11, No. 8 PP. 2149-67, August, 2018, DOI: 10.3390/en11082149.

Long Short-Term Memory Recurrent Neural Network for Remaining Useful Life Prediction of Lithium-Ion Batteries, Yongzhi Zhang, Rui Xiong, Hongwen He, and Michael G. Pecht, IEEE Transactions on Vehicular Technology, Vol. 67, PP. 56955-5705, July 2018, DOI: 10.1109/TVT.2018.2805189.

Computing Lifetime Distributions and Reliability for Systems With Outsourced Components: A Case Study, Yongquan Sun, Tieyuan Sun, Michael G. Pecht, and Chunyu Yu, IEEE Access, Vol. 6, PP. 31359-31366, 2018, DOI: 10.1109/ACCESS.2018.2843375.

Detection of Generalized-Roughness and Single-Point Bearing Faults Using Linear Prediction-Based Current Noise Cancellation, Fardin Dalvand, Myeongsu Kang, Satar Dalvand, and Michael Pecht, IEEE Transactions on Industrial Electronics , 2018.

Deep Residual Networks With Dynamically Weighted Wavelet Coefficients for Fault Diagnosis of Planetary Gearboxes, Minghang Zhao, Baoping Tang , Myeongsu Kang, Michael Pecht, IEEE Transactions on Industrial Electronics, Volume: 65, Issue: 5, May 2018, DOI: 10.1109/TIE.2017.2762639.

Hybrid Approach to Conduct Failure Prognostics of Automotive Electronic Control Unit Using Stress Sensor as In Situ Load Counter, Bulong Wu1, Alexandru Prisacaru, Alicja Palczynska, Przemyslaw Gromala, Bongtae Han, Dae-Suk Kim, IEEE Transactions on Components, Packaging and

 

Published in 2017

Impedance-Based Condition Monitoring for Insulation Systems Used in Low-Voltage Electromagnetic Coils, Noel Jordan Jameson, Michael H. Azarian, and Michael G. Pecht, IEEE Transactions on Industrial Electronics, Vol. 64, No. 5, pp. 3748-3757, May, 2017.

Signal Model-Based Fault Coding for Diagnostics and Prognostics of Analog Electronic Circuits, Zhenbao Liu, Taimin Liu, Junwei Han, Shuhui Bu, Xiaojun Tang, and Michael G. Pecht , IEEE Industrial Electronics Society, Vol. 64, Issue. 1, PP. 605-614, 2017, DOI:https://doi.org/10.1016/j.microrel.2016.12.015 .

A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries, Zheng-Xin Zhang, Xiao-Sheng Si, Chang-Hua Hu and Michael Pecht, IEEE Transactions on Reliability, Vol. PP, No. 99, September 2017.

A New Application for Failure Prognostics - Reduction of Automotive Electronics Reliability Test Duration, Andre Kleyner, Arvind Vasan, and Michael Pecht, Annual Conference of the Prognostics and Health Management Society 2017, pp 1-9, September 2017.

Electronic Circuit Health Estimation Through Kernel Learning, Arvind Vasan and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. PP, No. 99, July 2017.

A Double-Scale, Particle-Filtering, Energy State Prediction Algorithm for Lithium-Ion Batteries, Rui Xiong, Yongzhi Zhang, Hongwen He, Xuan Zhou, and Michael Pecht, IEEE Transactions on Industrial Electronics, PP 1526-1538, July 2017, DOI: 10.1109/TIE.2017.2733475.

Current Noise Cancellation for Bearing Fault Diagnosis Using Time Shifting, Fardin Dalvand, Satar Dalvand, Fatemeh Sharafi, and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 64, No. 10, October 2017.

Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model , Moon-Hwan Chang, Myeongsu Kang, and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 64, No. 7, July 2017.

Challenges and Research Issues of Data Management in IoT for Large-Scale Petrochemical Plants , Lei Shu, Mithun Mukherjee, Noel Crespi, Son n. Han and Michael G. Pecht, IEEE Systems Journal, pp. 1-15, 2017.

A Double-scale, Particle-filtering, Energy State Prediction Algorithm for Lithium-ion Batteries , Rui Xiong, Yongzhi Zhang, Hongwen He, Xuan Zhou and Michael G. Pecht IEEE Transactions on Industrial Electronics, pp. 1-1, 2017.

Fault Detection in Bearings Using Autocorrelation, Rushit N. Shah, Michael H. Azarian, Michael G. Pecht, Proceedings of the Society for Machinery Failure Prevention Technology Conference, May 15-18, 2017, Virginia Beach, VA.

A Review of Prognostic Techniques for High-Power White LEDs, Bo Sun, Xiaopeng Jiang, Kam-Chuen Yung, Jiajie Fan, and Michael Pecht, IEEE Transactions on Power Electronics, Vol. 32, No. 8, August 2017.

Interacting multiple model particle filter for prognostics of lithium-ion batteries, Xiaohong Su, Shuai Wang, Michael Pecht, Lingling Zhao, and Zhe Ye, Microelectronics Reliability, Vol. 70, pp. 59-69, February 2017.

Particle Learning Framework for Estimating the Remaining Useful Life of Lithium-Ion Batteries, Zhenbao Liu, Gaoyuan Sun, Shuhui Bu, Junwei Han, Xiaojun Tang, and Michael Pecht, IEEE Transactions on Instrumentation and Measurement, Vol. 66, No. 2, February 2017.

Prognostics of lithium-ion batteries based on different dimensional state equations in the particle filtering method, Xiaohong Su, Shuai Wang, Michael Pecht, Peijun Ma, Lingling Zhao, Transactions of the Institute of Measurement and Control 2017, Vol. 39(10) pp. 1537-1546, 2017.

 

Published in 2016

A Density-Based Clustering Method for Machinery Anomaly Detection, Jing Tian, Michael H. Azarian, and Michael Pecht, EEE Reliability Magazine, pp. 11-15, August 2016.

A Bayesian nonlinear random effects model for identification of defective batteries from lot samples, Edward Cripps and Michael Pecht, Journal of Power Sources, Vol. 342, pp. 342-350, December 2016.

Lifetime Estimation of Insulated Gate Bipolar Transistor Modules Using Two-step Bayesian Estimation, Yizhou Lu, Student Member, IEEE, and Aris Christou, Fellow, IEEE, IEEE Transactions on Reliability, 2016, DOI 10.1109/TDMR.2017.2694158.

A Hybrid Feature Selection Scheme for Reducing Diagnostic Performance Deterioration Caused by Outliers in Data-Driven Diagnostics , Myeongsu Kang, Md. Rashedul Islam, Jaeyong Kim, Jong-Myon Kim, and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 63, No. 5, May 2016 .

A Massively Parallel Approach to Real-Time Bearing Fault Detection Using Sub-Band Analysis on an FPGA-Based Multicore System, Myeongsu Kang, Jaeyoung Kim, In-Kyu Jeong, Jong-Myon Kim and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 63, no.10, pp 6325-6335, October 2016, doi:10.1109/TIE.2016.2574986.

A fusion prognostics-based qualification test methodology for microelectronic products, Michael Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, and Edward Cripps, Microelectronics Reliability, Vol. 63, pp 320-324, August 2016, DOI:10.1016/j.microrel.2016.04.002.

A Sequential k-Nearest Neighbor Classification Approach for Data-Driven Fault Diagnosis Using Distance- and Density-Based Affinity Measures, Myeongsu Kang, Gopala Krishnan Ramaswami, Melinda Hodkiewicz, Edward Cripps, Jong-Myon Kim and Michael Pecht, Springer International Publishing Switzerland, Vol. 9714, pp 253-261, June 2016.

Context-driven decisions for railway maintenance, R. Villarejo, D. Galar, P. Sandborn and U. Kumar, Proceedings of the Institution of Mechanical Engineers, Part F: Journal of Rail and Rapid Transit, Vol. 230 No. 5, pp. 1469-1483, July 2016.

PHM-Based Wind Turbine Maintenance Optimization Using Real Options, X. Lei and P.A. Sandborn, International Journal of Prognostics and Health Management, Vol. 7, No. 1, 2016.

Review of Quantitative Methods for Designing Availability-Based Contracts, A. R. Kashani Pour, P. Sandborn, and Q. Cui,Journal of Cost Analysis and Parametrics, Vol. 9, pp. 69-91, 2016, DOI:10.1080/1941658X.2016.1155185.

Motor bearing fault detection using spectral kurtosis-based feature extraction coupled with k-nearest neighbor distance analysis, Jing Tian, Carlos Morillo, Michael H. Azarian, Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 63, No. 3, 1793-1803, March 2016.

Probabilistic lifetime prediction of electronic packages using advanced uncertainty propagation analysis and model calibration, Hyunseok Oh, Hsiu-Ping Wei, Bongtae han and Byeng D. Youn, IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol 6, No 2, 238-248, February 2016.

 

Published in 2015

A Prognostics and Health Management Method for Instrumentation System Remanufacturing, Kai Wang, Aidong Xu, Jing Tian, and Michael Pecht, IEEE Conference on Technologies for Sustainability (SusTech), pp. 63-66, 2015.

Fault Diagnostic Opportunities for Solenoid Operated Valves Using Physics-of-Failure Analysis , N. Jordan Jameson, Michael Azarian, and Michael Pecht, 2014 International Conference on Prognostics and Health Management, Cheney, WA, 22-25 June, 2014.

Health Monitoring of Cooling Fan Bearings Based on Wavelet Filter , Wei He, Qiang Miao, Michael Azarian, and Michael Pecht, Mechanical Systems and Signal Processing, Vols. 64-65, pp. 149-161, December, 2015, DOI: 10.1016/j.ymssp.2015.04.002.

Opportunistic Maintenance for Multi-component Systems Considering Structural Dependence and Economic Dependence , Junbao Geng, Michael H. Azarian, and Michael G. Pecht, Journal of Systems Engineering and Electronics, Vol. 26, No. 3, June 2015, pp.493 – 501.

Remaining-Life Prediction of Solder Joints Using RF Impedance Analysis and Gaussian Process Regression , Daeil Kwon, Michael H. Azarian, and Michael G. Pecht, IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 5, No. 11, November 2015.

PHM Based Predictive Maintenance Option Model for Offshore Wind Farm O&M Optimization, X. Lei, P. Sandborn, N. Goudarzi Proceedings of the Annual Conference of the PHM Society, San Diego, CA October 2015.

Autocorrelation-based time synchronous averaging for condition monitoring of planetary gearboxes in wind turbines, Jong M. Ha, Byeng D. Youn, Hyunseok Oh, Bongtae Han, Yoongho Jung and Jungho Park, Mechanical Systems and Signal Processing, 70-71, 161-175, 23 October 2015.

Forecasting Technology and Part Obsolescence, P. Sandborn Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture, 2015.

PHM Based Predictive Maintenance Optimization for Offshore Wind Farms, Xin Lei, Peter Sandborn, Roozbeh Bakhshi, Amir Kashani-Pour and Navid Goudarzi Proceedings of the IEEE Prognostics and Health Management, Austin, TX, June 2015.

Physics-of-Failure, Condition Monitoring and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review, Hyunseok Oh, Bongtae Han, Patrick McCluskey, Changwoon Han and Byeng D. Youn. IEEE Transactions of Power Electronics, Vol. 30, No. 5, 2413-2426, May 2015.

Anomaly detection for IGBTs using Mahalanobis distance, Nishad Patil, Diganta Das and Michael Pecht , Microelectronics Reliability 55, pp 1054-1059, April 2015, DOI:10.1016/j.microrel.2015.04.001.

Return on Investment Modeling to Support Cost Avoidance Business Cases for Wind Farm O&M, Roozbeh Bakhshi, Peter Sandborn, Xin Lei and Amir Kashani-Pour , EWEA Offshore 2015, Copenhagen, Denmark, March 10-12, 2015.

A Bayesian Approach for Li-Ion Battery Capacity Fade Modeling and Cycles to Failure Prognostics , Jian Guo, Zhaojun Li and Michael Pecht , Journal of Power Sources, Vol. 281, no. 0, pp. 173-184, January 30, 2015, DOI:10.1016/j.jpowsour.2015.01.164.

Development of a Maintenance Option Model to Optimize Offshore Wind Farm O&M , Xin Lei, Peter Sandborn, Roozbeh Bakhshi and Amir Kashani-Pour , EWEA Offshore 2015, Copenhagen, Denmark, March 10-12, 2015.

 

Published in 2014

Prognostics and Health Management based Refurbishment for Life Extension of Electronic Systems, Prabhakar V. Varde, Jing Tian, and Michael G. Pecht , Proceedings of the IEEE International Conference on Information and Automation, July, 2014, Hailar, China.

Fusion Prognostics Based Qualification of Microelectronic Devices, Michael Pecht, Elviz George, Arvind Vasan , 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

An Examination of Glass-fiber and Epoxy Interface Degradation in Printed Circuit Boards, Bhanu Sood, Michael Osterman, and Michael Pecht ,IPC APEX Expo, March 25-27, 2014, Las Vegas, NV.

Evaluating covariance in prognostic and system health management applications, Sandeep Menon, Xiaohang Jin, Tommy W.S.Chow and Michael Pecht , Mechanical Systems and Signal Processing 58-59 (2015) 206-217.

State of Charge Estimation for Li-Ion Batteries Using Neural Network Modeling and Unscented Kalman Filter-based Error Cancellation, Datong Liu, Yue Luo, Jie Liu, Yu Peng, Limeng Guo and Michael Pecht, International Journal of Electrical Power & Energy Systems, Volume 62, pp 783-791, November 2014, DOI: 10.1016/j.ijepes.2014.04.059.

Lithium-Ion Battery Remaining Useful Life Estimation Based on Fusion Nonlinear Degradation AR Model and RPF Algorithm, Datong Liu, Yue Luo, Jie Liu, Yu Peng, Limeng Guo and Michael Pecht, Neural Computing and Applications, Volume 25, Issue 3-4, pp 557-572, September 2014, DOI: 10.1007/s00521-013-1520-x.

A Generic Model-Free Approach For Lithium-Ion Battery Health management, Guangxing Bai, Pingfeng Wanga, Chao Hub and Michael Pecht, Applied Energy, Vol. 135, pp 247-260, December 15, 2014, DOI: 10.1016/j.apenergy.2014.08.059.

In Situ Interconnect Failure Prediction Using Canaries , Preeti Chauhan, Sony Mathew, Michael Osterman and Michael Pecht, IEEE Transactions On Device and Materials Reliability, Vol. 14, No. 3, pp 826-832, September 2014, DOI: 10.1109/TDMR.2014.2326184.

Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based-Metric Test , Moon-Hwan Chang, Chaochao Chen, Diganta Das and Michael Pecht, IEEE Transactions on Industrial Informatics, Vol. 10, No. 3, pp 1852-1863, August 2014, DOI: 10.1109/TII.2014.2332116.

Prognostics of Lumen Maintenance for High Power White Light Emitting Diodes Using a Nonlinear Filter-based Approach , Jiajie Fan, Kam-Chuen Yung and Michael Pecht, Reliability Engineering & System Safety, Vol. 123, pp 63-72, March 2014, DOI:10.1016/j.ress.2013.10.005.

Prognostics of Chromaticity State for Phosphor-Converted White Light Emitting Diodes Using an Unscented Kalman Filter Approach , Jiajie Fan, Kam-Chuen Yung and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 1, pp 564-573, March 2014, DOI:10.1109/TDMR.2013.2283508.

Motor Bearing Fault Diagnosis Using Trace Ratio Linear Discriminant Analysis, Xiaohang Jin, Mingbo Zhao, Tommy W. S. Chow and Michael Pecht, IEEE Transactions On Industrial Electronics, Vol. 61, No. 5, pp 2441-2445, May 2014, DOI: 10.1109/TIE.2013.2273471.

Evaluating the End of Maintenance Dates for Electronic Assemblies Composed of Obsolete Parts, A. Konoza and P. Sandborn, ASME Journal of Mechanical Design, Vol. 136, No. 3, Jan 10, 2014, DOI: 10.1115/1.4026096.

Prognostics of Chromaticity State for Phosphor-Converted White Light Emitting Diodes Using an Unscented Kalman Filter Approach, Jiajie Fan, Kam-Chuen Yung and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 14, No. 1, pp 564-573, March 2014, DOI:10.1109/TDMR.2013.2283508.

 

Published in 2013

Effect of Multiple Faults and Fault Severity on Gearbox Fault Detection in a Wind Turbine using Electrical Current Signals ,Ranjith Kumar Sreenilayam Raveendran , Michael H. Azarian, Nam-Ho Kim, and Michael G. Pecht, Chemical Engineering Transactions, Vol. 33, PP.79-84, 2013, DOI: 10.3303/CET1333014.

Remaining Useful Life Prediction of Lithium-ion Battery with Unscented Particle Filter Technique ,Michael Pecht, Qiang Miao, Lei Xie, Hengjuan Cui, and Wei Liang, Microelectronics Reliability, Vol. 53, Issue. 6, PP. 805-810, June 2013.

Optimized Diagnostic Model Combination for Improving Diagnostic Accuracy , Surya Kunche, Chaochao Chen, and Michael Pecht, 2013 IEEE Aerospace Conference, 2-9 March, 2013.

A Bayesian Hidden Markov Model-Based Approach for Anomaly Detection in Electronic Systems ,Enkhjargal Dorj, Chaochao Chen, and Michael Pecht, 2013 IEEE Aerospace Conference, 2-9 March, 2013.

Challenges in the Qualification of Electronic Components and Systems ,Vidyu Challa, Peter Rundle, and Michael Pecht, IEEE Transactions on Device and Material Reliability, Vol. 13, No. 1, March 2013.

Prognostics of Lithium-Ion Batteries Based on Relevance Vectors and a Conditional Three-Parameter Capacity Degradation Model , Dong Wang, Qiang Miao, Michael Pecht , Journal of Power Sources, Volume 239, pp. 253-264, October 1, 2013, DOI:10.1016/j.jpowsour.2013.03.129.

Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance, Yu Wang, Qiang Miao, Eden W.M.Ma, Kwok-Leung Tsui and Michael G. Pecht, IEEE Transactions on Reliability, Vol. 62, No. 1, pp 136-145, March 2013, DOI: 10.1109/TR.2013.2241204.

Using Maintenance Options to Maximize the Benefits of Prognostics for Wind Farms, G. Haddad, P. A. Sandborn and M. G. Pecht, Wind Energy, Vol. 17, No. 5, pp 775-791, May 2013, DOI: 10.1002/we.1610.

Quantitative Analysis of Lithium-Ion Battery Capacity Prediction via Adaptive Bathtub-Shaped Function. Energies, Yi Chen, Qiang Miao, Bin Zheng, Shaomin Wu and Michael Pecht, Energies, Vol. 6, No. 6, pp. 3082-3096, 2013, DOI:10.3390/en6063082.

Reliability risk mitigation of free air cooling through prognostics and health management, Jun Dai, Diganta Das, Michael Ohadi, Michael Pecht, Applied Energy, Vol. 111, pp 104-112, November 2013, DOI:10.1016/j.apenergy.2013.04.047.

Degradation Data Analysis Using Wiener Processes With Measurement Errors, Zhi-Sheng Ye, YuWang, Kwok-Leung Tsui, and Michael Pecht, IEEE Transactions On Reliability, Vol. 62, No. 4, December 2013.

Health Monitoring of Lithium-ion Batteries, Bhanu Sood, Michael Osterman and Michael Pecht, 46th 2013 IEEE Symposium on Product Compliance Engineering (ISPCE), 7-9 October, 2013.

Vibration model of rolling element bearings in a rotor-bearing system for fault diagnosis , Feiyun Cong, Jin Chen, Guangming Dong, Michael Pecht, Journal of Sound and Vibration, Vol. 332, Issue 8, Pages 2081-2097, April 2013.

State of charge estimation for electric vehicle batteries using unscented kalman filtering, Wei He, Nicholas Williard, Chaochao Chen and Michael Pecht, Microelectronics Reliability, Vol. 53, Issue 6, Pages 840-847, June 2013.

Remaining useful life prediction of lithium-ion battery with unscented particle filter technique, Qiang Miao, Lei Xie, Hengjuan Cui, Wei Liang and Michael Pecht, Microelectronics Reliability, Vol. 53, Issue 6, Pages 805-810, June 2013.

Prognostics for state of health estimation of lithium-ion batteries based on combination Gaussian process functional regression, Datong Liu, Jingyue Pang, Jianbao Zhou, Yu Peng and Michael Pecht, Microelectronics Reliability, Vol. 53, Issue 6, Pages 832-839, June 2013.

An ensemble model for predicting the remaining useful performance of lithium-ion batteries, Yinjiao Xing, Eden W.M. Ma, Kwok-Leung Tsui and Michael Pecht, Microelectronics Reliability, Vol. 53, Issue 6, Pages 811-820, June 2013.

Process-Reliability Relationships in GaN and GaAs Field Effect Transistors and HFETs, Aris Christou , Compound Semiconductor Manufacturing Technology 2013, New Orleans, LA, May 13-16, 2013.

Reliability Predictions - Continued Reliance on a Misleading Approach, Christopher Jais, Benjamin Werner and Diganta Das, Reliability and Maintainability Symposium, Orlando, Florida, 28-31 January, 2013.

 

Published in 2012

A Bayes Approach and Criticality Analysis for Reliability Prediction of AlGaInP Light Emitting Diodes, M. Sawant and A. Christou, Reliability of Compound Semiconductors, 2012.

Influence of Parameter Initialization on Battery Life Prediction for Online Applications, Yinjiao Xingl, Eden W. M. Ma, K-L. Tsui, Michael Pecht, Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on, E-ISBN:978-1-4673-1680-4, pp. 1042-1046, August 13-16, 2012, Guilin, China, DOI:10.1109/ICEPT-HDP.2012.6474786.

Role of Prognostics in Support of Integrated Risk-based Engineering in Nuclear Power Plant Safety , P.V. Varde and Michael G. Pecht, International Journal of Prognostics and Health Management, Vol. 3, No. 1-2, pp. 59-80, 2012.

A Review of PHM System's Architectural Frameworks, S. Kunche, C. Chen, and M. Pecht , MFPT 2012: The Prognostics and Health Management Solutions Conference, 24-26 April, Dayton, OH, 2012.

Diagnosis of Rolling Element Bearing Fault in Bearing-Gearbox Union System Using Wavelet Packet Correlation Analysis, Jing Tian, Michael Pecht, and Changning Li, MFPT 2012: The Prognostics and Health Management Solutions Conference, 24-26 April, Dayton, OH, 2012.

A Fusion Approach for Anomaly Detection in Hard Disk Drives, Yu Wang, KL Tsui, Eden W. M. Ma, and Michael Pecht, IEEE Prognostics & System Health Management Conference, PHM, Beijing, 2012.

Review of Offshore Wind Turbine Failures and Fault Prognostic Methods, Bill Chun Piu Lau, Eden Wai Man Ma, and Michael Pecht, IEEE Prognostics & System Health Management Conference, PHM, Beijing, 2012.

Use of Temperature as a Health Monitoring Tool for Solder Interconnect Degradation in Electronics, P. Chauhan, M. Osterman, M. Pecht, and Q. Yu IEEE Prognostics & System Health Management Conference, PHM, Beijing, 2012.

Fan Bearing Fault Diagnosis Based on Continuous Wavelet Transform and Autocorrelation, Lei Xie, Qiang Miao, Yi Chen, Wei Liang, and Michael Pecht, IEEE Prognostics & System Health Management Conference, PHM, Beijing, 2012.

Prognostics of Lithium-Ion Batteries Using Model Based and Data-Driven Methods, Chaochao Chen and Michael Pecht, IEEE Prognostics & System Health Management Conference, PHM, Beijing, 2012.

Identification of Failure Mechanisms to Enhance Prognostic Outcomes, Sony Mathew, Mohammed Alam, and Michael Pecht, Journal of Failure Analysis and Prevention, Vol. 12, Issue 1, PP. 66-73, 2012, DOI: 10.1007/s11668-011-9508-2.

A Prognostics and Health Management Strategy for Complex Electronic Systems, Bing Long, Houjun Wang, Qiang Miao, and Michael Pecht, IEEE Prognostics & System Health Management Conference, PHM, Beijing, 2012.

Lifetime Estimation of High-Power White LED using Degradation-Data-Driven Method, Jiajie Fan, Kam-Chuen Yung, and Michael Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 2, pp. 470-477, June 2012.

Comparison of Statistical Models for the Lumen Lifetime Distribution of High Power White LEDs, Jiajie Fan, K.C.Yung, Michael Pecht, IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing), Beijing , pp. 1-7, May 23-25,2012.

A novel electrostatic Radio Frequency Micro Electromechanical Systems (RF MEMS) with Prognostics function, Yunhan Huang, Michael Osterman and Michael Pecht, IEEE Electronic Components and Technology Conference (ECTC), Vol., No., pp. 121-126, May 29,2012 - June 1,2012, DOI:10.1109/ECTC.2012.6248816

Strategic Management of Component Obsolescence Using Constraint-Driven Design Refresh Planning, R. Nelson III and P. Sandborn, International Journal of Product Life-cycle Management,, Vol. 6, No. 2/2012, March 2012, DOI : 10.1504/IJPLM.2012.052656.

Strategies for the Prediction, Mitigation and Management of Product Obsolescence, B. Bartels, U. Ermel, P. Sandborn and M. Pecht, Wiley, 2012.

An Evaluation of End of Maintenance Dates for Electronic Assemblies, A. Konoza and P. Sandborn, Proceedings of the Aircraft Airworthiness & Sustainment Conference, Baltimore, MD, April 2012.

A Part Total Ownership Cost Model for Long-Life Cycle Electronic Systems, V. Prabhakar and P. Sandborn, International J. of Computer Integrated Manufacturing, Vol. 25, Nos. 4-5, pp. 384-397, 2012.

Prognostics-Based Risk Mitigation for Telecom Equipment Under Free Air Cooling Conditions, Jun Dai, Diganta Das and Michael Pecht, Applied Energy, Vol. 99, pp. 423-429, Nov. 2012.

A Canary Device Based Approach for Prognosis of Ball Grid Array Packages, S.Mathew, M.Osterman and M.Pecht, IEEE Conference on Prognostics and Health Management (PHM), Denver, CO, June 18 - 22, 2012.

Prognostics and Health Management: Utilizing the Life Cycle Knowledge to Reduce Life Cycle Cost, Diganta Das, 1stInternational Symposium on Physics and Technology of Sensors (ISPTS), pp.1, 2012.

Simulation Assisted Physics of Failure based Reliability Assessment, Mei-Ling Wu, Elviz George and Michael Pecht, Joint Conference of International Conference on Electronics Packaging and IMAPS All Asia Conference, Tokyo Big Sight, Tokyo, Japan, 17-20 April, 2012.

Anomaly Detection for Insulated Gate Bipolar Transistor (IGBT) under Power Cycling using Principal Component Analysis and K-Nearest Neighbour Algorithm, Edwin Sutrisno, Qingguo Fan, Diganta Das and Michael Pecht, Journal of the Washington Academy of Sciences, Spring 2012.

Diagnostics and Prognostics Method for Analog Electronic Circuits, Arvind Sai Sarathi Vasan, Bing Long and Michael Pecht IEEE Transactions on Industrial Electronics, Vol. 60, 2012.

Prognostics Method for Analog Electronic Circuits, Arvind Sai Sarathi Vasan, Bing Long and Michael Pecht, Annual Conference of Prognostics and Health Management Society, 2012.

Estimation of Remaining Useful Life of Ball Bearings using Data Driven Methodologies, Edwin Sutrisno, Hyunseok Oh, Arvind Sai Sarathi Vasan and Michael Pecht, IEEE Conference on Prognostics and Health Management, 2012.

Lifetime Estimation of High-Power White LED Using Degradation-Data-Driven Method, J. Fan, K.-Chuen Yung and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 12, No. 2, pp. 470-477, June 2012.

Cost Optimization for Canary-Equipped Electronic Systems in Terms of Inventory Control and Maintenance Decisions, W. Wang, Y. Liu and M. Pecht, IEEE Transactions on Reliability, Vol. 61, No. 2, pp. 323-335, June 2012.

Benefits and Challenges of System Prognostics, B. Sun, S. Zeng, R. Kang and M. Pecht, IEEE Transactions on Reliability, Vol. 61, No. 2, pp. 323-335, June 2012.

Anomaly Detection of Polymer Resettable Circuit Protection Devices, S. Cheng, K. Tom and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 12, No 2, June 2012.

Nvidia's GPU Failures: A case for Prognostics and Health Management, M. Pecht, Microelectronics Reliability, Vol. 52, Issue 6, pp. 953-957, June 2012.

Economic Design of the Mean Prognostic Distance for Canary-Equipped Electronic Systems, Wenbin Wang, Shuxin Luo, M. Pecht, Microelectronics Reliability, Vol. 52, Issue 6, pp. 1086-1091, June 2012.

Life Prediction of LED-Based Recess Down-light Cooled by Synthetic Jet, Liyu Zheng, Janis Terpenny, Peter Sandborn, Raymond Nelson III, Microelectronics Reliability, Vol. 52, Issue 5, Pages 937-948, DOI: 10.1016/j.microrel.2011.04.014, May 2012.

Canary Approach for Monitoring BGA Interconnect Reliability Under Temperature Cycling, P. Chauhan, M. Osterman and M. Pecht, The MFPT 2012 Proceedings, 2012.

Model Based Battery Management System for Condition Based Maintenance, Nick Williard, Wei He, and M Pecht, MFPT 2012 Proceedings, 2012.

IEEE 1413: A Standard for Reliability Predictions, J. G. Elerath and M. Pecht, IEEE Transactions on Reliability, Vol. 61, No. 1, March 2012.

Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process, X. Si, W. Wang, C.Hu, D. Zhou and M. Pecht, IEEE Transactions on Reliability, Vol. 61, No. 1, March 2012.

Using Cross-Validation for Model Parameter Selection of Sequential Probability Ratio Test, S. Cheng and M. Pecht, Expert Systems with Applications, 39 (2012) 8467-8473, 2012.

Novel Approach to Improve Electronics Reliability in the Next Generation of US Army Small Unmanned Ground Vehicles Under Complex Vibration Conditions , Ed Habtour, Cholmin Choi, Michael Osterman and Abhijit Dasgupta , Journal of Failure Analysis and Prevention: DOI 10.1007/s11668-011-9533-1, 2012.

A Prognostic Approach for Non-Punch Through and Field Stop IGBTs, N. Patil, D. Das, and M. Pecht, Microelectronics Reliability 52 (2012) 482-488, 2012.

Identification of Failure Mechanisms to Enhance Prognostic Outcomes, S. Mathew, M. Alam, and M. Pecht, ASM Journal of Failure Analysis and Prevention, Journal of Failure Analysis and Prevention: Vol. 12, Issue 1, Page 66-73, 2012.

Prognostics of Multilayer Ceramic Capacitors Via the Parameter Residuals, Jianzhong Sun, Shunfeng Cheng, and M. Pecht, IEEE Transactions on Device and Materials, Vol. 12, Issue,1, pp. 49-57, 2012.

 

Published in 2011

Physics-Based Common Cause Failure Modeling in Probabilistic Risk Analysis: A Mechanistic Perspective, Zahra Mohagegh, Mohammed Modarres, and Aris Christou, Proceedings of the ASME 2011 Power Conference, , July 12-14, 2011, Denver, CO.

A Real Options Optimization Model to Meet Availability Requirements for Offshore Wind Turbines, Michael Pecht, Gilbert Haddad, and Peter Sandborn, 2011.

PHM Enabled Logistics PHM Enabled Logistics (Return on Investment and Availability Management), Peter Sandborn, 2011 PHM Conference Shenzhen, May 24, 2011.

Guaranteeing High Availability of Wind Turbines, Michael Pecht, G. Haddad, P.A. Sandborn, T. Jazouli, B. Foucher, and V. Rouet, Advances in Safety, Reliability and Risk Management, Aug 2011.

Prognostics of Polymer Positive Temperature Coefficient Resettable Fuses, Michael Pecht, Shunfeng Cheng, and Kwok Tom, MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, 10-12 May 2011.

Using PHM to Meet Availability-Based Contracting Requirements, Taoufik Jazouli and Peter Sandborn, 2011 IEEE Conference on Prognostics and Health Management, 20-23 June, 2011.

Rolling Element Bearing Fault Feature Extraction Using EMD-Based Independent Component Analysis, Michael Pecht, C.H. Wu, C.H. Yang, S.C. Lo, N. Vichare, and E. Rhem, 2011 IEEE Conference on Prognostics and Health Management, 20-23 June, 2011.

Remaining Useful Performance Analysis of Batteries, Michael Pecht, Wei He, Nicholas Williard, and Michael Osterman, 2011 IEEE Conference on Prognostics and Health Management, 20-23 June, 2011.

Prognostics and Health Management's Potential Benefits to Warranty, Michael Pecht, Yan Ning, and Peter Rundle, The Seventh Annual Warranty Chain Management Conference, San Diego, CA, 15-17 March, 2011.

Determining a Dynamic Maintenance Threshold Using Maintenance Options, Michael Pecht, Peter Sandborn, and Gilbert Haddad, World Congress on Engineering Asset Management, Cincinnati, OH, Oct. 2011.

Applications of Health Monitoring to Wind Turbines, Michael Pecht, Michael H. Azarian, Ranjith S.R. Kumar, Nishad Patil, and Anshul Shrivastava, Proceeding of the 24th International Congress on Condition Monitoring and Diagnostics Engineering Management, Stavanger, Norway, 30 May - 1 June, 2011.

Complex System Maintainability Verification with Limited Samples, Michael Pecht, QiangMiao, Liu Liu, and YuanFeng, Microelectronics Reliability, Vol. 51, Issue 2, PP. 294-299, Feb 2011.

Optimization of PHM System for Electronic Assemblies Using Maintenance Aware Design Environment Software, Sandeep Menon, Chris Stecki, Jiaqi Song and Michael Pecht, AIAC14 Fourteenth Australian International Aerospace Congress.

A Prognostics and Health Management Roadmap for Information and Electronics- Rich Systems Michael Pecht, IEICE Fundamentals Review Vol.3 No. 4, August 2011.

Return on Investment of a LED Lighting System, Yuchen Li, Michael Pecht, Shunong Zhang and Rui Kang, Prognostics and System Health Management Conference 2011, Shenzhen, China, pp. 1-5, May 24-25, 2011, DOI:10.1109/PHM.2011.5939555.

Prognostics and health monitoring for lithium-ion battery, Yinjiao Xing, Qiang Miao, K.-L. Tsui and Michael Pecht, IEEE International Conference on Intelligence and Security Informatics (ISI), 2011, Vol., No., pp.242-247, July 10-12, 2011, DOI:10.1109/ISI.2011.5984090.

Economic Analysis of Canary-Based Prognostics and Health Management, Wenbin Wang and Michael Pecht, IEEE Transactions on Industrial Electronics, Vol. 58, No. 7, pp. 3077 - 3089, July 2011, DOI:10.1109/TIE.2010.2072897.

Prognostics of Systems: Approaches and Applications, S.Mathew and M.Pecht, Proceedings of the 24th International Congress on Condition Monitoring and Diagnostic Engineering Management (COMADEM 2011), Norway, May 31- June 2, 2011.

Prognostics of Failures in Embedded Planar Capacitors using Model-based and Data-Driven Approaches, Alam M., M.H. Azarian, M. Osterman, and M. Pecht, Journal of Intelligent Material Systems and Structures, Vol. 22, pp. 1293-1304, Aug. 2011.

A Part Total Ownership Cost Model for Long-Life Cycle Electronic Systems, V. Prabhakar and P. Sandborn, International Journal of Computer Integrated Manufacturing, Vol. 24, 2011.

Part Sourcing Decisions of Long Life Cycle Products, V. Prabhakar and P. Sandborn, ASME International Design Engineering Conferences & Computers and Information in Engineering Conference, Washington DC, 2011.

Strategic Management of Component Obsolescence Using Constraint-Driven Design Refresh Planning, R. Nelson III and P. Sandborn, ASME International Design Engineering Conferences & Computers and Information in Engineering Conference,Washington DC, 2011.

The Evaluation of End-of-Repair/End-of-Maintenance Dates for Electronic Assemblies, P. Sandborn, A. Konoza, R. Nelson III, D. Gerdes, and M. Shamet, Proceedings DMSMS Conference, Hollywood, FL, August 2011.

Research on Features for Diagnostics of Filtered Analog Circuits Based on LS-SVM, Bing Long, Shulin Tian, Qiang Miao, and M. Pecht, IEEE, 2011.

A Health Indicator Method for Degradation Detection of Electronic Products, S. Kumar, N. M. Vichare, E. Dolev, and M. Pecht, Microelectronics Reliability, 52 (2012) 439-445, 2011.

Prognostics of lithium-ion batteries based on Dempster Shafer theory and the Bayesian Monte Carlo method, W.He, N. Williard, M. Osterman, M. Pecht, Journal of Power Sources 196 (2011) 10314-10321, 2011.

Disassembly methodology for conducting failure analysis on lithium-ion batteries, N. Williard, B. Sood, M. Osterman, and M. Pecht, Journal of Material Sciences: Material Electron (2011) 22:1616-1630, 2011.

Battery Management Systems in Electric and Hybrid Vehicles,Yinjiao Xing, Eden W. M. Ma, Kwok L. Tsui and M. Pecht, Energies 2011, 4, 1840-1857; DOI:10.3390/en4111840, Oct. 2011.

Experimental Validation of LS-SVM Based Fault Identification in Analog Circuits Using Frequency Features, A. Vasan, B. Long, and M. Pecht, World Congress on Engineering Asset Management, 2011, 6th Annual Conference, Cincinnati, Ohio, Oct. 2011.

Investigation of Stochastic Differential Models and a Recursive Nonlinear Filtering Approach for Fusion-Prognostics, A. Vasan and M. Pecht, Annual Conference of the Prognostics and Health Management Society, Montreal, Quebec, Sept. 2011.

Physics-of-Failure-Based Prognostics and Health Management for High-Power White Light-Emitting Diode Lighting, J. Fan, K. C. Yung, and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 11, No. 3, pp. 407-416, September 2011.

Prognostics of Failures in Embedded Planar Capacitors using Model-Based and Data-Driven Approaches, M. Alam, M. Azarian, M. Osterman, and M. Pecht, Journal of Intelligent Material Systems and Structures, August 2011.

Forecasting Technology Procurement Lifetimes for Use in Managing DMSMS Obsolescence, P. Sandborn, V. Prabhakar and O. Ahmad, Microelectronics Reliability, Vol. 51, pp. 392-399, 2011.

Guaranteeing High Availability of Wind Turbines, G. Haddad, P.A. Sandborn, T. Jazouli, M. Pecht, B. Foucher, and V. Rouet, 2011 ESREL Conference, Troyes, France, September 18-22, 2011.

Method for Valuating Options Arising in PHM, G. Haddad, P. Sandborn, and M. Pecht, 2011 IEEE International Conference on Prognostics and Health Management, Denver, CO, June 20-23, 2011.

Using Real Options to Manage Condition-Based Maintenance Enabled by PHM, G. Haddad, P. Sandborn, and M. Pecht, 2011 IEEE International Conference on Prognostics and Health Management, Denver, Colorado, June 20-23, 2011 .

Cooling Fan Bearing Fault Identification Using Vibration Measurement, Q. Miao, M. Azarian, and M. Pecht, IEEE: International Prognostics and Health Management Conference, Denver CO, 21st to 23rd June 2011.

Rolling Element Bearing Fault Feature Extraction Using EMD-Based Independent Component Analysis, Q. Miao, D. Wang, and M. Pecht, IEEE: International Prognostics and Health Management Conference, Denver CO, June 21-23, 2011.

Remaining Useful Performance Analysis of Batteries, W. He, N. Williard, M. Osterman, and M. Pecht, IEEE: International Prognostics and Health Management Conference, Denver CO, June 21-23, 2011.

Using PHM to Meet Availability-Based Contracting Requirements,T. Jazouli and P. Sandborn, IEEE: International Prognostics and Health Management Conference, Denver CO, 21st to 23rd June 21-23, 2011.

Ontology-Based Knowledge Representation for Product Life-Cycle Concepts and Obsolescence Forecasting, L. Zheng, R. Nelson, III, J. Terpenny, P. Sandborn, Proceedings of Industrial Engineering Research Conference, Reno, NV, May 2011.

Estimation Of Fan Bearing Degradation Using Acoustic Emission Analysis And Mahalonabis Distance, H. Oh, M. Azarian, and M. Pecht, MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, May 10-12, 2011.

A Real Options Optimization Model To Meet Availability Requirements For Offshore Wind Turbines, G. Haddad, P. Sandborn, and M. Pecht, MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, May 10-12, 2011.

Identification Of Failure Mechanisms To Enhance Prognostic Outcomes, S. Mathew, M. Alam, and M. Pecht, MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, May 10-12, 2011.

Prognostics for Polymer Positive Temperature Coefficient Resettable Fuses, S. Cheng, K. Tom, and M. Pecht, MFPT: The Applied Systems Health Management Conference 2011, Virginia Beach, Virginia, May 10-12, 2011.

Prognostics of Lithium-ion Batteries using Extended Kalman Filtering, W. He, N. Williard, M. Osterman, and M. Pecht, IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011.

Predicting Remaining Capacity of Batteries for UAVs and Electric Vehicle Applications, N. Williard, W. He, M. Osterman, M. Pecht, IMAPS Advanced Technology Workshop on High Reliability Microelectronics for Military Applications, Linthicum Heights, MD, May 17-19, 2011.

Prognostics-based Health Management for Telecom Equipment under Free Air Cooling, J. Dai, D. Das, and M. Pecht, EUROCON 2011, Lisbon, Portugal, April 27-29, 2011.

Software Reliability Analysis of Laptop Computers, W. Wang and M. Pecht, Proceedings of 7th IMA Conference for Modeling Industrial Maintenance and Reliability, Cambridge, UK., April 18-20, 2011.

Health Monitoring of Electronic Products Based on Mahalanobis Distance and Weibull Decision Metrics, G. Niu, S. Singh, S.W. Holland, and M. Pecht, Microelectronics Reliability, Vol. 51, Issue 2, pp. 279-284, Feb 2011.

 

Published in 2010

A Prognostics and Health Management for Information and Electronics-Rich Systems, Michael Pecht, Journal of Japan Institute of Electronics Packaging, Vol. 13 No. 7, 2010.

Anomaly Detection of Non Punch Through Insulated Gate Bipolar Transistors (IGBT) by Robust Covariance Estimation Techniques, Nishad Patil, Sandeep Menon, Diganta Das and Michael Pecht 2010 second International Conference on Reliability, Safety & Hazard (ICRESH-201O).

Evaluation Of Robust Covariance Estimation Techniques For Anomaly Detection Of Insulated Gate Bipolar Transistors (IGBT), Nishad Patil, Sandeep Menon, Diganta Das and Michael Pecht Proceedings of the ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems SMASIS2010 September 28 - October 1, 2010, Philadelphia, Pennsylvania, USA.

A Design for Availability Approach for Use with PHM, T. Jazouli and P. Sandborn, Proceedings of the International Conference on Prognostics and Health Management, Portland, OR, October 2010.

Forward-stepwise Regression Analysis for Fine Leak Batch Testing of Multiple MEMS Package, C. Jang, B. Youn, P. F. Wang. B. Han and S.-J. Ham, Microelectronics Reliability, Vol. 18, No. 3, pp. 577-587, 2010.

The Use of “Canaries” for Adaptive Health Management of Electronic Systems, A. Dasgupta, R. Doraiswami, M. Azarian, M. Osterman, S. Mathew, and M. Pecht, ADAPTIVE 2010, IARIA Conference, Lisbon Portugal, Nov 21-26, 2010.

Calculating the Return on Investment for DMSMS Management (Presentation), P. Sandborn, Proceedings DMSMS Conference, Las Vegas, NV, October 2010.

A Probabilistic Description Scheme for Rotating Machinery Health Evaluation, Q. Miao, D. Wang and M. Pecht, Journal of Mechanical Science and Technology Vol. 24, No. 12 pp. 2421-2430, 2010.

Prognostics and Health Assessment Implementation for Electronic Products, J. Gu and M. Pecht, Journal of the IEST, Vol. 53, No. 1, pp. 44 - 58, April 2010.

Modeling Approaches for Prognostics and Health Management of Electronics, S. Kumar and M. Pecht, International Journal of Performability Engineering, Vol. 6, No. 5, pp. 467-476, September 2010.

Prognostics of Embedded Planar Capacitors Under Temperature and Voltage Aging, M. Alam, M. Azarian, M. Osterman, and M. Pecht, ASME Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Philadelphia, PA, 2010.

Failure Precursors for Polymer Resettable Fuses, S. Cheng, K. Tom and M. Pecht, IEEE Transactions on Devices and Materials Reliability, Vol. 10, Issue. 3, pp.374-380, 2010. 

Computer Manufacturing Management Integrating Lean Six Sigma and Prognostic Health Management, G. Niu, D. Lau and M. Pecht, International Journal of Performability Engineering, Vol. 6, No. 5, pp. 453-466, September 2010.

Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test, D. Kwon, M. Azarian and M. Pecht, International Journal of Performability Engineering, Vol. 6, No. 5, pp. 443-452, September 2010.

Application of Grey Prediction Model for Failure Prognostics of Electronics, J. Gu, N. Vichare, B. Ayyub and M. Pecht, International Journal of Performability Engineering, Vol. 6, No. 5, pp. 435-442, September 2010.

Approach to Fault Identification for Electronic Products Using Mahalanobis Distance, S. Kumar, T.W.S. Chow and M. Pecht, IEEE Transactions on Instrumentation and Measurement, Vol. 59, No. 8, pp. 2055-2064, August 2010.

Validation of Reliability Capability Evaluation Model Using a Quantitative Assessment Process, S. Tiku and M. Pecht, International Journal of Quality & Reliability Management, Vol. 27, No. 8, pp. 938-952, 2010.

A Prognostics and Health Management Roadmap for Information and Electronics-Rich Systems, M. Pecht, IEICE Fundamentals Review, Vol. 3, No. 4, pp. 25-32, 2010.

Automatic Data Mining for Telemetry Database of Computer Systems, C.-H. Wu, C.-H. Yang, S.-C. Lo, N. Vichare, E. Rhem, M. Pecht, Microelectronics Reliability, Vol. 51, PP. 263-269, October, 2010.

Mahalanobis Distance Approach to Field Stop IGBT Diagnostics, N. Patil, D. Das and M. Pecht, Proceedings of the 10th International Seminar on Power Semiconductors, Prague, pp.79-84, 1-3 September 2010.

Mahalanobis Distance Approach for Insulated Gate Bipolar Transistor (IGBT) Diagnostics, N. Patil, D. Das and M. Pecht, Proceedings of the 17th International Conference on Concurrent Engineering, Cracow, pp.583-591, 6-10 September 2010.

Anomaly Detection through a Bayesian Support Vector Machine, V. Sotiris, P.W. Tse and M. Pecht, IEEE Trans. on Reliability, Vol. 59, No. 2, pp. 277-286, June 2010.

Degradation of Digital Signal Characteristics Due to Intermediate Stages of Interconnect Failure, D. Kwon, M. H. Azarian and M. Pecht, Fourteenth IEEE Workshop on Signal Propagation on Interconnects, Hildesheim, Germany, May 9-12, 2010.

Sensor Systems for Prognostics and Health Management, S. Cheng, M. Azarian and M. Pecht, Sensors, No. 10, pp.5774-5797, 2010.

A Wireless Sensor System for Prognostics and Health Management, S. Cheng, K. Tom, L. Thomas and M. Pecht, IEEE Sensors Journal, Vol. 10, Issue 4, pp. 856 – 862, 2010.

Anomaly Detection Through a Bayesian Support Vector Machine, V. Sotiris, P. Tse and M. Pecht, Journal of Transaction on Reliability, Vol. 1, No. 1, pp. 1-11, June 2010.

Development of an optimized condition-based maintenance system by data fusion and reliability-centered maintenance, G. Niu, B. Yang and M. Pecht, Reliability Engineering and System Safety, Issue. 95, pp. 786-796, March 2010.

A Prognostics and Health Management Roadmap for Information and Electronics-rich Systems, R. Jaai and M. Pecht, Microelctronics Reliability, Vol. 50, pp. 317-323, March 2010.

Prognostics in Wireless Telecare Networks: A Perspective on Serving the Rural Chinese Population, Fong, B. and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Benefits Analysis of Prognostics in Systems, Sun, B., S. Zeng, R. Kang and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Prognostics and Health Management for Energetic Materials Systems, Niu, G., D. Anand and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Status of Research and Development on Prognostics and Health Management in China, Zhang, S., R. Kang, G. Niu and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Improving Computer Manufacturing Management through Lean Six Sigma and PHM, Niu, G., D. Lau and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Physics-of-Failure Approach for Fan PHM in Electronics Applications, Oh, H., M. Azarian and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Anomaly Detection of Notebook Computer Based on Weibull Decision Metrics, Niu, G., S. Singh, S.W. Holland and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Prognostics-based Health Management for Free Air Cooling of Data Centers, Dai, J., D. Das and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Study of Ensemble Learning-based Fusion Prognostics, Sun, J., H. Zuo, H. Yang and M. Pecht, 2010 Prognostics & System Health Management Conf., Macau, China, Jan. 12-14, 2010.

Parameter Selection for Health Monitoring of Electronic Products, Sachin Kumar, Eli Dolev and Michael Pecht, Microelectronics Reliability, Vol. 50, pp. 161–168, 2010.

 

Published in 2009

Prognostics Implementation in Aerospace Applications, , Michael Pecht, Prognostics and Health Management, Condition-Based Maintenance and Health & Usage Monitoring Symposium, 21-22 April, 2009.

Methods for Probabilistic Fault Diagnosis: An Electrical Power System Case Study , Brian W. Ricks, Ole J. Mengshoel, Annual Conference of the Prognostics and Health Management Society, 2009.

Benchmarking Diagnostic Algorithms on an Electrical Power System Testbed , Tolga Kurtoglu, Sriram Narasimhan, Scott Poll, David Garcia, Stephanie Wright, Annual Conference of the Prognostics and Health Management Society, 2009.

Prognostics Enhanced Reconfigurable Control of Electro-Mechanical Actuators, Douglas W. Brown, George Georgoulas, Brian Bole, Hai-Long Pei, Marcos Orchard, Liang Tang, Bhaskar Saha, Abhinav Saxena, Kai Goebel, George Vachtsevanos, Annual Conference of the Prognostics and Health Management Society, 2009.

Towards Accelerated Aging Methodologies and Health Management of Power MOSFETs, Jose R. Celaya, Nishad Patil, Sankalita Saha, Phil Wysocki, Kai Goebel, Annual Conference of the Prognostics and Health Management Society, 2009.

Modeling Li-ion battery capacity depletion in a particle filtering framework, Bhaskar Saha, Kai Goebel, Annual Conference of the Prognostics and Health Management Society, 2009.

Application of Blind Source Separation Techniques for Generation of PHM Useful Information, Bruno P. Leão, João P. P. Gomes, Roberto K. H. Galvão, Takashi Yoneyama, Annual Conference of the Prognostics and Health Management Society,2009.

Analysis of Built-In Self-Tests for Electronic Control Units, K. Wojtek Przytula, David Allen, Tsai-Ching Lu, Noel Anderson, and Jason Wanner, Annual Conference of the Prognostics and Health Management Society, 2009.

Using Tear-down Analysis as a Vehicle to Teach Electronic Systems Manufacturing Cost Modeling, Peter Sandborn, Jessica Myers, Thomas Barron, and Micheal Mccarthy, Int. Journal of Eng. Education, Vol. 25, No. 1, pp. 42-52, 2009.

Precursor Monitoring Approach for Reliability Assessment of Cooling Fans, H. Oh, T. Shibutani, M. Pecht, J Intell Manuf, DOI 10.1007/s10845-009-0342-2, 2009.

Using Tear-down Analysis as a Vehicle to Teach Electronic Systems Manufacturing Cost Modeling, Peter Sandborn, Jessica Myers, Thomas Barron, and Micheal Mccarthy, Int. Journal of Eng. Education, Vol. 25, No. 1, pp. 42-52, 2009.

A Methodology for Determining the Return on Investment Associated with Prognostics and Health Management, K. Feldman, T. Jazouli, and P. Sandborn, IEEE Trans. on Reliability, Strasbourg, Vol. 58, No. 2, pp. 305-316, June 2009.

Health Monitoring and Prognostics of Electronics Subject to Vibration Load Conditions, J. Gu, D. Barker, and M. Pecht, IEEE Sensors Journal, Vol. 9, No. 11, pp. 1479-1485, November 2009.

Baseline Performance of Notebook Computers Under Various Environmental and Usage Conditions for Prognostics, S. Kumar and M. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 3, pp. 667–676, September 2009.

Model-based and Data-driven Prognosis of Automotive and Electronic Systems, C. Sankavaram, B. Pattipati, A. Kodali, K. Pattipati, M. Azam, S. Kumar, and M. Pecht, 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, pp. 96-101, August 22-25, 2009.

A Fusion Prognostics Method for Remaining Useful Life Prediction of Electronic Products, Shunfeng Cheng and Michael Pecht, 5th Annual IEEE Conference on Automation Science and Engineering, Bangalore, India, pp. 102-107, August 22-25, 2009.

A Rapid Life-Prediction Approach for PBGA Solder Joints Under Combined Thermal Cycling and Vibration Loading Conditions,H. Qi, M. Osterman and M. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 32, No. 2, pp. 283-292, June 2009.

Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics, N. Patil, J. Celaya, D. Das, K. Goebel, and M. Pecht, IEEE Transactions on Reliability, Vol. 58, No. 2, pp. 271-276, June 2009.

Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications, L.D. Lopez and M.G. Pecht, IEEE Transactions on Reliability, Vol. 58, No. 2, pp. 264-270, June 2009.

Health Assessment and Prognostics of Electronic Products: An Alternative to Traditional Reliability Prediction Methods, J. Gu and M. Pecht, Electronics Cooling, Vol. 15, No. 2, pp. 10-16, May 2009.

Physics-of-failure-based Prognostics for Electronic Products, M. Pecht and J. Gu, Transactions of the Institute of Measurement and Control, Vol. 31, No. 3/4, pp. 309–322, 2009.

Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance, D. Kwon, M. H. Azarian, M. Pecht, IEEE Trans. on Device and Materials Reliability, Vol. 9, No. 2, , pp. 296-304, Jun. 2009.

A Framework for Cost-effective and Accurate Maintenance Combining CBM RCM and Data Fusion, G. Niu and M. Pecht, 8th International Conference on Reliability, Maintainability and Safety, July 20 - 24, 2009.

Reliability, Maintainability, and Availability, Michael Pecht, in Handbook of Systems Engineering and Management. Ed. Andrew P. Sage and William B. Rouse. 2nd ed. Wiley-Interscience, New York, NY, pp. 361-95, 2009.

Copper Pad Dissolution and Microstructure Analysis of Reworked Plastic Grid Array Packages in Lead-free and Mixed Assemblies, L. Nie, M. Osterman, and M. Pecht, SMTA Journal, Vol. 22, No. 2, pp. 13-20, 2009.

Precursor Monitoring Approach for Reliability Assessment of Cooling Fans, Hyunseok Oh, Tadahiro Shibutani, and Michael Pecht, Proceedings of International Conference of Electronics Packaging, Kyoto, Japan, April 2009.

Reliability Design and Case Study of a Refrigerator Compressor Subjected to Repetitive Loads, Seong-woo Woo, Dennis L. O'Neal, and Michael Pecht, International Journal of Refrigeration, Vol. 32, pp. 478-486, 2009.

A Residual Estimation Based Approach for Isolating Faulty Parameters, S. Kumar, E. Dolev, M. Pompetzki, and M. Pecht, IEEE Aerospace Conference, Big Sky, MT, March 7-14, 2009.

Prognostics-Based Product Qualification, M. Pecht and J. Gu, IEEE Aerospace Conference, Big Sky, MT, March 7-14, 2009.

 

Published in 2008

Failure Prognostics of Multilayer Ceramic Capacitors in Temperature-Humidity-Bias Conditions , Jie Gu, Michael H. Azarian, and Michael G. Pecht 2008 International Conference on Prognostics and Health Management, October 6-9, 2008, Denver, CO.

Health Assessment of Electronic Products using Mahalanobis Distance and Projection Pursuit Analysis, S. Kumar, V. Sotiris, M. Pecht, International Journal of Computer, Information, Systems Science, and Engineering, vol. 2, no. 4, pp. 242 - 250, Fall 2008.

Designing Engineering Systems for Sustainability, P. Sandborn and J. Myers, Handbook of Performability Engineering, ed. K. B. Misra, Springer, pp. 81-104, 2008.

Reliability Integrated Engineering Using Physics-of-Failure, Weiqiang Wang, Diganta Das, Michael Osterman, and Michael Pecht, Book Chapter for: Encyclopedia of Statistics in Quality and Reliability, John Wiley & Sons, Ltd, Chichester, UK, 2008.

Modeling and simulation of shock and drop loading for complex portable electronic systems, F. Askari, M. Al- Bassyiouni, A. Dasgupta, ASME International Mechanical Engineering Congress and Exposition, Paper No. IMECE2008-67749,Boston, MA, Nov 2008.

The Analysis of Return on Investment for PHM Applied to Electronic Systems, Kiri Feldman, Peter Sandborn, and Taoufik Jazouli, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO, Oct 6-9,2008.

Failure Precursors for Insulated Gate Bipolar Transistors, Nishad Patil, Diganta Das, Kai Goebel, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO,Oct 6-9, 2008.

IDDQ Trending as a Precursor to Semiconductor Failure , Guangfan Zhang, Diganta Das, Roger Xu, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO,Oct 6-9, 2008.

Failure Mechanism Based Prognostics, Sony Mathew, Diganta Das, Roger Rosenberger, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO,Oct 6-9, 2008.

Assessing the Operating Environment of IC Sockets in High-End Servers for Prognostics and Health Monitoring, Leoncio Lopez and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO,Oct 6-9, 2008.

Early Detection of Interconnect Degradation Using RF Impedance and SPRT, Daeil Kwon, Michael H Azarian, and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO,Oct 6-9, 2008.

Maxima-SPRT Methodology for Health Monitoring of Contact Resistance in IC Sockets, Leoncio Lopez and Michael Pecht, Proceedings of the 1st International Conference on Prognostics and Health Management, Denver, CO,Oct 6-9, 2008.

Identification of Failure Precursor Parameters for Insulated Gate Bipolar Transistors (IGBTs), N. Patil, D. Das, K. Goebel and M. Pecht, Proceedings of the IEEE Prognostics and Health Management Conference, Denver, COOctober 2008.

An Electronic Part Total Ownership Cost Model, P. Sandborn and V. Prabhakar, Proceedings DMSMS Conference, Palm Springs, CA,September 24, 2008.

Advanced Part Obsolescence Forecasting as an Enabler for Strategic Management of DMSMS Problems, P. Sandborn and O. Ahmad, Proceedings DMSMS Conference, Palm Springs, CA,September 24, 2008.

Anomaly Detection in Electronic Products, Abraham Tomy Michael, Sachin Kumar, Sony Mathew and Michael Pecht, 2nd Electronics System-Integration Technology Conference,, Greenwich, London, UK,September 1-4, 2008.

Constraint-Driven Refresh Planning of Systems Subject to Obsolescence, P. Sandborn and R. Nelson III, Proceedings DMSMS Conference, Palm Springs, CA, September 2008.

The Application of Product Platform Design to the Reuse of Electronic Components Subject to Long-Term Supply Chain Disruptions, P. Sandborn, V. Prabhakar, and B. Eriksson Proceedings of the ASME 2008 International Design Engineering Conferences & Computers and Information in Engineering Conference, New York, NY, Aug. 6, 2008.

Sensor System Selection for Prognostics and Health Monitoring, S. Cheng, M. Azarian, and M. Pecht, 2008 ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference (IDETC/CIE 2008), Brooklyn, New York, USA,August 3-6, 2008.

Analysing the Return on Investment Associated With Prognostics and Health Management of Electronic Products, Kiri Feldman and Peter Sandborn, 2008 ASME International Design Engineering Technical Conferences & Computers and Information in Engineering Conference (IDETC/CIE 2008), Brooklyn, New York, USA,August 3-6, 2008.

Failure Precursors for Insulated Gate Bipolar Transistors, N. Patil, D. Das, K. Goebel and M. Pecht, 9th International Seminar on Power Semiconductors, Prague, 27-29 August 2008.

A Hybrid Prognostics Methodology for Electronics Systems, S. Kumar, M. Torres, M.Pecht, and Y. C. Chan - Special Session on Computational Intelligence for Anomaly Detection, Diagnosis, and Prognosis, IEEE World Congress on Computational Intelligence (WCCI 2008),Hong Kong, June 1-6, 2008.

Prognostics of Electronics under Vibration Using Acceleration Sensors, Jie Gu, Donald Barker, and Michael Pecht, Proceeding for 62nd Meeting of the Society for Machinery Failure Prevention Technology (MFPT), pp. 253-263, Virginia Beach, VA,May 2008.

Autonomous Prognostic Monitoring Device, S.Cheng, M. Torres, L. Thomas, and M. Pecht, Proceedings of the 62th Meeting of the Society for Machinery Failure Prevention Technology, pp.505-516 , Virginia Beach, VA, May 2008.

Minimizing Life Cycle Cost by Managing Product Dependability via Validation Plan and Warranty Return Cost, A. Kleyner and P. Sandborn, International Journal of Production Economics, Vol. 112, No. 2, pp. 796-807, April 2008.

Mahalanobis Distance and Projection Pursuit Analysis for Health Assessment of Electronic Systems, S. Kumar, V. Sotiris, and M. Pecht, IEEE Aerospace Conference, Big Sky, Montana, March 2008.

Data Analysis Approach for System Reliability, Diagnostics and Prognostics, S. Kumar and M. Pecht, Pan Pacific Microelectronics Symposium,Hawaii, 22 - 24 Jan, 2008.

Analyzing the Return on Investment Associated with Prognostics and Health Management of Electronic Products, Michael Pecht and Tadahiro Shibutani, Proceedings of the ASME 2008 International Design Engineering Technical Conferences & Computers and Information in Engineering Conference, August 3 - 6, 2008, Brooklyn, New York, USA.2008.

An Innovative Approach to Electromechanical Actuator Emulation and Damage Propagation Analysis , Neil Kunst and Chris Lynn, 2008.

Prognostics and Health Management Using Physics of Failure, J. Gu and M. Pecht, 54th annual Reliability and Maintainability Symposium (RAMS), Las Vegas, Nevada, Jan. 2008.

No-fault-found and Intermittent Failures in Electronic Products, Qi. Haiyu., S. Ganesan and M. Pecht, Microelectronics Reliability, Vol. 48, Issue 5, pp. 663-674, May 2008.

China's Efforts in Prognostics and Health Management, Shunong Zhang, Rui Kang, Xiaofei He, and Michael G. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 31, No. 2, June 2008.

 

Published in 2007

Introduction to Special Section on Electronic Systems Prognostics and Health Management, Michael Pecht and Peter Sandborn, Microelectronics Reliability, Vol. 47, Issue. 12, PP. 1847-1848, December 2007.

Integrating Technology Obsolescence Considerations Into Product Design Planning, Kiri Feldman, Peter Sandborn, ASME 2007 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, 4 - 7 Sept, 2007.

Software Obsolescence- Complicating the Part and Technology Obsolescence Management Problem, Peter Sandborn, IEEE Trans on Components and Packaging Technologies, Vol. 30, No. 4, pp. 886-888, , December 2007.

DMSMS Lifetime Buy Characterization Via Data Mining of Historical Buys, Peter Sandborn, Proceedings DMSMS Conference, Orlando, FL, November 2007.

Optimizing Embedded Passive Content in Printed Circuit Boards, Bevin Etienne and Peter Sandborn , IEEE Trans. on Electronics Packaging Manufacturing, Vol. 30, No. 4, pp. 246-257, October 2007.

Lifetime Buy Optimization to Minimize Life-cycle Cost , Dan Feng, Pameet Singh and Peter Sandborn, Proceedings of the 2007 Aging Aircraft Conference, 2007.

Cost Model for Assessing the Transition to Lead-Free Electronics , Peter Sandborn and Rifat Jafreen, Proceedings of the 2007 Aging Aircraft Conference, 2007.

A Maintenance Planning and Business Case Development Model for the Application of Prognostics and Health Management (PHM) to Electronic Systems , Peter Sandborn and Chris Wilkinson , Microelectronics Reliability, Vol. 47, No. 12, pp. 1889-1901 , Dec. 2007.

Life Cycle Cost Impact of using Prognostic Health Management (PHM) for Helicopter Avionics , E. Scanff, K.L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Fouch, Microelectronics Reliability 47 (2007) 1857-1864, 2007.

Introduction to Special Section on Electronic Systems Prognostics and Health Management , M. Pecht and Peter Sandborn, Microelectronics Reliability, Vol. 47, No. 12, pp. 1847-1848, December 2007.

Advanced Electronic Prognostics Through System Telemetry and Pattern Recognition Methods, L. Lopez, Microelectronics Reliability, Vol. 47, Issue 12, PP. 1865 - 1873, December, 2007.

Environment and Usage Monitoring of Electronic Products for Health Assessment and Product Design, N. Vichare, P. Rodger, V. Eveloy, and M. Pecht, International Journal of Quality Technology and Quantitative Management, 2007.

Multivariate State Estimation Technique for Remaining Useful Life Prediction of Electronic Products, S. Cheng and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 26-32, Arlington, VA, Nov, 2007.

Health Monitoring of Electronic Products Using Symbolic Time Series Analysis, S. Kumar and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 73-80, Arlington, VA, Nov, 2007.

Support Vector Prognostics Analysis of Electronic Products and Systems, V. Sotiris and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp. 120-127, Arlington, VA, Nov, 2007.

Prognostics Implementation of Electronics under Vibration Loading, J. Gu, D. Barker and M. Pecht, Microelectronics Reliability, Vol. 47, Issue 12, pp. 1849-1856, Dec. 2007.

Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration, J. Gu, D. Barker, and M. Pecht, AAAI Fall Symposium on Artificial Intelligence for Prognostics, pp.50-57, 2007.

Embedded Remaining Life Prognostics and Diagnostics of Electronics, V. Rouet, A. Delye, N. Vichare, M. Pecht, and B. Foucher, MicroNanoReliability Congress, Berlin, Germany, September 2-5, 2007.

Prognostics of Ceramic Capacitor Temperature-Humidity-Bias Reliability Using Mahalanobis Distance Analysis, L. Nie, M. Azarian, M. Keimasi, and M. Pecht, Circuit World, Vol. 33, No.3, pp. 21-28, 2007.

Technology Assessment of Sensor Systems for Prognostics and Health Monitoring, B. Tuchband, S. Cheng, and M. Pecht, IMAPS on Military, Aerospace, Space and Homeland Security: Packaging Issues and Applications (MASH), May, 2007.

New Methods to Predict Reliability of Electronics, J. Gu and M. Pecht, Proceedings of the Seventh International Conference on Reliability, Maintainability and Safety, pp 440-451, 2007.

Energetic Material/Systems Prognostics, D. Han, M. Pecht, D. Anand, and R. Kavetsky, 53rd Annual Reliability & Maintainability Symposium (RAMS), Florida, 2007.

Virtual Remaining Life Assessment of Electronic Hardware Subjected to Shock and Random Vibration Life Cycle Loads, S. Mathew, D. Das, M. Osterman, M. Pecht, R. Ferebee, and J. Clayton, Journal of the IEST, Vol. 50, No. 1, pp 86-97, April 2007.

The Use of Prognostics in Military Electronic Systems, B. Tuchband and M. Pecht, Proceedings of the 32nd GOMACTech Conference, pp. 157-160, Lake Buena Vista, FL, March 19-22, 2007.

An Enhanced Prognostic Model for Intermittent Failures in Digital Electronics, G. Zhang, C. Kwan, R. Xu, N. Vichare, and M. Pecht, IEEE Aerospce Conference, Big Sky, MT, March 2007.

Prognostics Implementation Methods for Electronics, J. Gu, N. Vichare, T. Tracy, and Michael Pecht, 53rd Annual Reliability & Maintainability Symposium (RAMS), Florida, 2007.

Advanced iterative algorithm for randomly phase-shifted interferograms with intra- and inter-frame intensity variations , Zhaoyang Wang and Bongtae Han, Optics and Lasers in Engineering, Vol 45, No 2, 274-280, February 2007.

 

Published in 2006

Ensemble Based Systems in Decision Making, R. Polikar, IEEE Circuits and Systems Magazine, PP. 21-45, Third Quarter, 2006.

Prognostics Assessment of Aluminum Support Structure on a Printed Circuit Board, S. Mathew, D. Das, M. Osterman, M. Pecht, and R. Ferebee, ASME Journal of Electronic Packaging, Vol. 128, Issue 4, pp. 339-345, December 2006.

Enabling Electronic Prognostics Using Thermal Data, N. Vichare and M. Pecht, Proceedings of the 12th International Workshop on Thermal Investigation of ICs and Systems, Nice, Côte d'Azur, France, 27-29 September 2006.

Establishing a Relationship Between Warranty and Reliability, M. Pecht, IEEE Transactions on Electronics Packaging Manufacturing, Vol. 29, No. 3, pp. 184- 190, July 2006.

Forecasting the Cost of Unreliability for Products with Two-Dimensional Warranties, A. Kleyner and P. Sandborn, Proceedings of the European Safety and Reliability Conference (ESREL), Estoril, Portugal, Sept 18-22, 2006.

A Methodology for Assessing the Remaining Life of Electronic Products, S. Mathew, P. Rodgers, V. Eveloy, N. Vichare, and M. Pecht, International Journal of Performability Engineering, Vol. 2, No. 4, pp. 383-395, October, 2006.

Using Reverse Engineering as a Vehicle to Teach Electronic Systems Manufacturing Cost Modeling, P. Sandborn, J. Myers, T. Barron, and M. McCarthy, Proceedings of the International Electronics Packaging Education Conference (at the Electronic Components and Technology Conference), May 30, 2006.

Methods for Binning and Density Estimation of Load Parameters for Prognostics and Health Management, Vichare N., Rodgers P., and Pecht, M., International Journal of Performability Engineering, Vol. 2, No. 2, pp. 149-161, April 2006.

Prognostics and Health Management of Electronics , N. Vichare and M. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 1, pp. 222-229, March 2006.

Implementation of Six Sigma Quality System in Celestica with Practical Examples, L. Ladani, D. Das, J. Cartwright, R. Yenkner, and J. Razmi, Int. J. Six Sigma and Competitive Advantage, Vol. 2, No. 1, pp. 69-88, 2006. 

 

Published in 2005

Environment and Usage Monitoring of Electronic Products for Health Assessment and Product Design, N. Vichare, P. Rodgers, V. Eveloy, and M. Pecht, IEEE Workshop on Accelerated Stress Testing and Reliability (ASTR), Austin, TX, USA, October 2-5, 2005.

A Tin Whisker Risk Assessment Algorithm, T. Fang, M. Osterman, and M. Pecht, 38th International Symposium on Microelectronics, Reliability I, Issues in Packaging, pp. 61-65, Philadelphia, PA, September 25-29, 2005.

Numerical Heat Transfer Predictive Accuracy for an In-Line Array of Board-Mounted PQFP Components in Free Convection, V. Eveloy, P. Rodgers and M. Hashmi, Transactions of the ASME, Journal of Electronic Packaging, Vol. 127, No. 3, pp. 245-254, September 2005.

Prediction of Electronic Component-Board Transient Conjugate Heat Transfer, V. Eveloy and P. Rodgers, IEEE Transactions on Components and Packaging Technologies, Vol. 28, No. 4, pp. 817-829, December 2005.

A Warranty Forecasting Model Based on Piecewise Statistical Distributions and Stochastic Simulation, A. Kleyner and P. Sandborn, Reliability Engineering and System Safety, Vol. 88, No. 3, pp. 207-214, June 2005.

A Data Mining Based Approach to Electronic Part Obsolescence Forecasting, P. Sandborn, F. Mauro, and R. Knox,Proceedings DMSMS Conference, Nashville, TN, April 2005.

Development of Predictive Modeling Scheme for Flip-Chip on Fine Pitch Flex Substrate, C. Jang, S. Han, Y. Kim, and H. Kim, S. Yoon, S. Cho, C. Han, and B. Han, 6th International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Micro-Electronics and Micro-Systems, pp. 566-574, EuroSimE, April 2005.

A Decision Support Model for Determining the Applicability of Prognostic Health Management (PHM) Approaches to Electronic Systems, P. Sandborn, Proc. Reliability and Maintainability Symposium, pp. 422-427, January 24-27, 2005.

A Decision Support Model for Determining the Applicability of Prognostic Health Management (PHM) Approaches to Electronic Systems, P. Sandborn, Proceedings Reliability and Maintainability Symposium, pp. 422-427, January 24-27, 2005. 

 

Published in 2004

An Efficient Optimization Method for the Reconstruction of Multiple Profiles, F. Seydou, T. Seppanen, and O. Ramahi, IEEE Antennas and Propagation Society Symposium, Vol. 1, pp. 209-212, June 20-25, 2004.

Life Consumption Monitoring for Electronics Prognostics, S. Mishra, S. Ganesan, M. Pecht and J. Xie, Proceedings of the IEEE Aerospace Conference, Vol. 5, pp. 3455 - 3467, March 6-13, 2004.

Application of Numerical Analysis to the Optimisation of Electronic Component Reliability Screening and Assembly Processes, V. Eveloy, P. Rodgers, and M. Hashmi, Journal of Materials Processing Technology, Vol. 155-156, pp. 1788-1796, 2004.

Forecasting Technology Insertion Concurrent with Design Refresh Planning for COTS-Based Electronic Systems, P. Sandborn and P. Singh, Proceedings of the International Society of Logistics (SOLE) International Conference and Exhibition, Norfolk, VA, September 2004.

Prognostics and Health Management for Improved Dispatchability of Integrated Modular Avionics Equipped Aircraft, C. Wilkinson, 23rd Digital Avionics Systems Conference (DASC), Salt Lake City, UT, October 2004.

Application of Health Monitoring to Product Take-Back Decisions, N. Vichare, P. Rodgers, M. Azarian, and M. Pecht, Proceedings of the Joint International Congress and Exhibition - Electronics Goes Green 2004, pp. 945-951, Berlin, Germany, September 6-8, 2004.

Prognostics and Health Management for Avionics, Wilkinson, C., Humphrey, D., Vermeire, B., and Houston, J., IEEE Aerospace Conference, Big Sky, MT, March 2004.

Application of In-Situ Health Monitoring and Prognostic Sensors, J. Xie and M. Pecht 9th Pan Pacific Microelectronics Symposium Exhibits and Conference, Kahuku, Oahu, Hawaii, 10-12 February 2004.

Minimization of Life Cycle Costs Through Optimization of the Validation Program - A Test Sample Size and Warranty Cost Approach, A. Kleyner, P. Sandborn, and J. Boyle, Reliability and Maintainability Symposium, Los Angeles, CA, January 2004.

Applications of In-Situ Health Monitoring and Prognostic Sensors, J. Xie and M. Pecht, the 9th Pan Pacific Microelectronics Symposium Exhibits & Conference, Kahuku, Oahu, Hawaii, 10-12 February, 2004. 

 

Published in 2003

Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms, Zhen Shi and Peter Sandborn, Proceedings of the International Test Conference, October 2003.

Computer Aided Reliability Assessment, J. Wu, M. Pecht and J. Wang, Proceedings of the Fifth International Conference on Electronic Packaging Technology (ICEPT2003), pp. 36-39, October 28-30, 2003.

Reliability Prediction Modeling of Semiconductor Light Emitting Device, J. Xie and M. Pecht, IEEE Transactions on Device and Materials Reliability, Vol. 3, No. 4, pp. 218-222, December 2003.

Remaining Life Assessment of Aging Electronics in Avionic Applications, R. Valentin, M. Osterman, and B. Newman, The Annual Reliability and Maintainability, 2003 Proceedings, pp. 313-318, Tampa Florida, January 27-30, 2003.

 

Published in 2002

In-situ Sensors for Product Reliability Monitoring, Mishra, S. and Pecht, M., Proceedings of SPIE, Vol. 4755, pp. 10-19, 2002.

Remaining Life Assessment of Shuttle Remote Manipulator System End Effector, V. Shetty, D. Das, M. Pecht, D. Hiemstra, and S. Martin, Proceedings of the 22nd Space Simulation Conference, Ellicott City, MD, October 21-23, 2002.

Remaining Life Prediction of Electronic Products Using Life Consumption Monitoring Approach, S. Mishra, M. Pecht, T. Smith, I. McNee, and R. Harris, Proceedings of the European Microelectronics Packaging and Interconnection Symposium, pp. 136-142, Cracow, June 16-18, 2002.

The IEEE Standards on Reliability Program and Reliability Prediction Methods for Electronic Equipment, M. Pecht, D. Das, and A. Ramakrishnan, Microelectronics Reliability, Vol. 42, pp. 1259-1266, 2002.

Determining Optimum Redesign Plans for Avionics Considering Electronic Part Obsolescence Forecasts, P. Singh, P. Sandborn, D. Lorenson, and T. Geiser, Proceedings World Aviation Congress (SAE Technical Paper: 2002-1-3012), Phoenix, AZ, November 2002.

Aging Aircraft Usable Life and Wear-out Issues, D. Humphrey, W. Shawlee, P. Sandborn, and D. Lorenson, Proceedings World Aviation Congress (SAE Technical Paper: 2002-1-3013), Phoenix, AZ, November 2002.

Electronic Part Obsolescence Driven Design Refresh Optimization, P. Sandborn and P. Singh, Proceedings FAA/DoD/NASA Aging Aircraft Conference, San Francisco, CA, September 2002.

Electronic Part Obsolescence Driven Design Refresh Optimization, P. Singh, P. Sandborn, T. Geiser, and D. Lorenson, Proceedings International Conference on Concurrent Engineering, pp. 961-970, Cranfield University, UK, July 2002.

A Detailed Cost Model for Concurrent Use With Hardware/Software Co-Design, D. Ragan, P. Sandborn, and P. Stoaks, Proceedings IEEE Design Automation Conference, pp. 269-274, New Orleans, LA, June 2002.

A Review of Reliability Prediction Methods for Electronic Devices, B. Foucher, J. Boullie, B. Meslet, and D. Das, Microelectronics Reliability, Vol. 42, No. 8, pp. 1155-1162, August, 2002. 

 

Published in 2001

A New Test/Diagnosis/Rework Model for Use in Technical Cost Modeling of Electronic Systems Assembly, T. Trichy, P. Sandborn, and S. Sahasrabudhe, Proceedings of the International Test Conference, pp. 1108-1117, Baltimore MD, November 2001.

Prediction of Shielding Degradation Arising from Variation in Contact Impedance of Intermetallic Junctions, L. Li and O. Ramahi, IEEE Antennas and Propagation Society International Symposium, Boston MA, July 8-13, 2001.

Reliability Engineering in the 21st Century - A Focus on Predicting the Reliability of Electronic Products and Systems, M. Pecht, Proceedings of The 5th ICRMS 2001, Vol. 1, pp. 1-19, Dalian, China, August 28-31, 2001.

On the Use of Yielded Cost in Modeling Electronic Assembly Processes, D. Becker and P. Sandborn, IEEE Transactions on Electronics Packaging Manufacturing, Vol. 24, No. 3, pp. 195-202, July 2001.

A Demonstration of Virtual Qualification for the Design of Electronic Hardware, J. Cunningham, R. Valentin, C. Hillman, A. Dasgupta, and M. Osterman, ESTECH 2001, IEST, Phoenix, AZ, April 2001.

 

Published in 2000

Method for Assessing Remaining Life in Electronic Assemblies, P. McCluskey, J. Kweon, J. Kim and H. Jeon, Microelectronics Reliability, Vol. 40, No. 2, pp. 293-306, 2000.

Electronic Part Life Cycle Concepts and Obsolescence Forecasting, R. Solomon, P. Sandborn and M. Pecht, IEEE Transactions on Components and Packaging Technologies, Vol. 23, No. 3, pp. 707-717, December 2000.

 

Published in 1999

Failure Assessment Software for Circuit Card Assemblies, M. Osterman and T. Stadterman, Annual Proceedings of Reliability and Maintainability Symposium, pp. 269-276, January 18-21, 1999.

A Model for Optimizing the Assembly and Disassembly of Electronic Systems, P. A. Sandborn and C. F. Murphy, IEEE Transactions on Electronics Packaging Manufacturing, Vol. 22. No. 2, pp. 105-108, April 1999.

A Risk-Informed Methodology for Parts Selection and Management, M. Jackson, P. Sandborn, M. Pecht, C. Hemens-Davis, and P. Audette, Quality and Reliability Engineering International, Vol. 15, pp. 261-271, September 1999.

Lifetime Resistance Model of Bare Metal Electrical Contacts, M. Sun, M. Pecht, M. Natishan, and R. Martens, IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part B (Advanced Packaging), Vol. 22, No. 1, February 1999.


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