Test Laboratory 

Panelists:

Dan Tang, GETS;

Dan Tang is the Founder, President, and CEO of Global ETS, LLC, a global leader in independent testing and authentication services for electronic components. With over 30 years of industry experience—including 15 years in operational leadership at Vishay Electronics—Dan combines deep technical expertise with hands-on production insight. At Global ETS, he has championed the integration of automation, AI-powered testing, and advanced authentication to combat counterfeit components and safeguard global supply chains. His work has earned widespread recognition across defense, aerospace, and commercial markets, setting new standards in quality control and supply chain security.

 

Devon Richman, University of Maryland

Devon Richman is a  Ph.D. candidate at the Center for Advanced Life Cycle Engineering (CALCE), University of Maryland. He holds a B.S. (2019) and M.S. (2023) in Mechanical Engineering from the same institution. Devon is an active member of the SAE G-19A Test Laboratory Standards Development Committee and a technical expert for the ANSI National Accreditation Board for SAE AS6171. His research focuses on side-channel analysis, counterfeit microelectronics detection, and failure analysis. He has collaborated with industry leaders including GE, Cummins, AWS, and Microsoft.

 

Ken Tuner, Hi-Rel Laboratories;

Ken Turner serves as the Failure Analysis Department Manager at Hi-Rel Laboratories, bringing over 20 years of specialized experience in the failure analysis of high-reliability electronic components and assemblies. His expertise supports mission-critical sectors including Aerospace, Defense, Medical, Automotive, Energy, and Commercial applications. Ken’s technical focus includes root cause analysis, materials characterization, and reliability assessment of complex microelectronic and electromechanical systems. He leads in-depth investigations into design, process, and materials failures, enabling clients to identify failure mechanisms and implement effective corrective actions to prevent recurrence.

 

 

Michael Azarian, University of Maryland

Dr. Michael Azarian is a research scientist at the Center for Advanced Life Cycle Engineering (CALCE), University of Maryland. He holds a Ph.D. and M.S. in Materials Science from Carnegie Mellon University and a B.S. in Chemical Engineering from Princeton University. His research focuses on failure detection, prediction, and analysis in electronic components, with over 150 publications and 6 U.S. patents. Dr. Azarian chairs the SAE G-19A committee for the AS6171 standards and the IEEE 1624 working group. Prior to CALCE, he held roles in the disk drive and fiber optics industries, including positions at Bookham Technology and Philips Research.

 

Nicholas William, SMT Corporation

Dr. Nicholas Williams is the Lab Director at SMT Corporation, overseeing authentication and electrical testing labs. He earned his B.S. (2010) and Ph.D. (2016) in Electrical Engineering from the University of Connecticut. Since joining SMT in 2016 as a Senior Electrical Engineer, he has advanced through roles including Electrical Test Lab Manager before becoming Lab Director in 2019.

 

 

Roger Muse, ANSI National Accreditation Board (ANAB)

Roger Muse is the Vice President of Business Development and Training at the ANSI National Accreditation Board (ANAB), where he brings over 21 years of experience in accreditation and standards. He leads marketing, business development, and designs accreditation solutions for both government and industry programs. Roger has held leadership roles in international accreditation organizations, including ILAC and IAF. ANAB, the largest accreditation body in the Western Hemisphere, provides accreditation and training services across more than 80 countries.