Issues Related to Counterfeit Using Used / Aged Parts – Update of Study on Detection of Aged Parts
Sultan Ali Lilani [Integra Technologies]
Abstract:
The testing of counterfeit microcircuits parts has largely been focused on physical and obvious signs of counterfeiting. The counterfeiters have gotten so good to look for any obvious signs of counterfeiting that we hardly see many physically altered failures. A big concern of the user community, especially Aerospace and Defense section, has been how reliable the parts are when used parts are sold as new. It has the potential of majority of useful life being already being consumed.
The presentation will explore the following:
- Why is it very hard to detect used parts using conventional electrical testing.
- Why is it hard to detect if the lot has parts with long term usage or extended sample life test since counterfeiters sprinkle different device pedigrees within a lot.
- If degradation of certain electrical parameters happens with usage of parts.
- If packaging material degradation happens with usage.
Biography:
Sultan Ali Lilani is Director of Technical Business Development at Integra Technologies. Prior to joining Integra Technologies, Sultan held a similar position at Hi-Reliability Microelectronics, a Division of Silicon Turnkey Solutions. Previous to Hi-Rel Microelectronics, Sultan was Director of Quality and Reliability at NEC Electronics for 18 years and also served as Director of Product and Test at Akros Silicon, an energy management IC start-up. Sultan has in-depth knowledge of Reliability Engineering, Program Management, Testing and Qualification for Aerospace, Defense and Industrial applications for semiconductor products including Digital, Analog, Mixed Signal, ASICs, Microprocessors, Memory, Custom Semiconductors, Discretes, Linears and Passives. Sultan is the co-chair of SAE G19A Counterfeit Committee which is developing standards to detect suspect counterfeit components, promoting the maxim use of authentic parts, and helping ensure consistency of test techniques and requirements across the supply-chain. He is an active participant in various technical committees including G12.
Dr. Diganta Das
For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das.
Kristin Nafstad
For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Kristin Nafstad.
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