How to Use Side-Channel Assessment to Detect Counterfeit Microelectronics

Devon Richman [CALCE,University of Maryland]

Abstract: 

To be Updated.

Biography: 

Mr. Devon Richman is a Ph.D. candidate at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland College Park. He received his bachelor’s degree in mechanical engineering from the University of Maryland in 2019 and his Masters in 2023. He is an active member of the SAE G-19A Test Laboratory Standards Development Committee and a technical expert for the ANSI National Accreditation Board for SAE AS6171. Mr. Richman’s primary research interests are the use of side-channel methods for assessing the reliability of microelectronic devices, detection of counterfeit microelectronics, and failure analysis of electronic systems. He has worked on the analysis of current standards-based counterfeit detection methods as well as side-channel and machine vision detection systems. He has done work, including failure analysis, for industry leaders including General Electric, Cummins, Amazon Web Services, and Microsoft.

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