An Update on the SAE AS6171 Standards for Detection of Counterfeit Electronic Parts

Dr. Michael H. Azarian [CALCE, University of Maryland]

Abstract:

SAE AS6171 is the leading industry standard governing laboratory testing and inspection for detection of counterfeit electrical, electronic, and electromechanical (EEE) parts. SAE AS6171 is unique among standards in the following respects:

• Risk determines the amount and type of testing that must be performed.
• The coverage of counterfeit defects is quantified and used to identify a test set appropriate to the level of risk.
• The suitability of a test laboratory for performing the tests is based on their accreditation by a third-party accreditation body to ensure adequacy and consistency of personnel training, methods, equipment, interpretation of results, and reporting.
• The selection of parts for testing is based on randomized statistical sampling from a lot.
• It contains a wide array of test methods, providing enhanced ability to detect counterfeit parts and meet future challenges.

This presentation will provide an update on the status of document revision and development efforts concerning the family of SAE AS6171 standards, including the revision or reaffirmation of published test method slash sheets; the development of new slash sheets; the inclusion of tampered parts and EEE assemblies in the scope; changes to certain requirements; and modifications to the list of counterfeit defects.

Biography:

Dr. Michael H. Azarian is a research scientist at the Center for Advanced Life Cycle Engineering (CALCE) at the University of Maryland. He holds a Master's and Ph.D. in Materials Science from Carnegie Mellon University, and a Bachelor's degree in Chemical Engineering from Princeton University. Dr. Azarian’s primary research interests are detection, prediction, and analysis of failures in electronic components and assemblies. He has over 150 publications on electronics reliability and packaging, prognostics and health management, and tribology, and holds 6 U.S. patents. Prior to joining CALCE, he spent over a dozen years in the disk drive and fiber optics industries, having worked at Bookham Technology, W.L. Gore, Censtor, and Philips Research Laboratories. Dr. Azarian is chair of the SAE G-19A Test Laboratory Standards Development Committee which is responsible for the AS6171 family of standards on the detection of counterfeit electrical, electronic, and electromechanical parts. He is also co-chairman of the Miscellaneous Techniques sub-group of the G-19A committee. He chairs the working group responsible for the IEEE 1624 standard on the organizational reliability capability of suppliers of electronic products. He was previously chair for the IEEE 1332 Standard on reliability programs.

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das

Kristin Nafstad

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