Traceability Across Semiconductor Lifecycle Transitions

Yaw S. Obeng [NIST] presenting on behalf of David Huntley [SEMI]

Abstract: 

The talk will cover the SEMI standards and the new SEMI Traceability Phase initiative aimed at addressing the need to trace device-level genealogy across the supply chain. It will cover the concept of the virtual identifier thread (VIT) recorded on distributed ledger technology (DLT). The VIT would link to root of trust (RoT) technologies to anchor it to the real world. The overall intent is to preserve identity continuity and optimize data linkage across semiconductor lifecycle transitions.

Biography of Yaw S. Obeng: 

Yaw Obeng has been at NIST since 2007, with extensive experience from the microelectronic industry. He conducts research into new measurement techniques of assessing reliability in electronic materials and emerging nano-electronic devices, with special interest in the interconnects and advanced packaging. He is also interested in supply chain integrity, especially in counterfeit electronics mitigation. He serves as subject matter expert and technical leader in international standards development, and international semiconductor technology roadmaps development.

Obeng previously worked with AT&T Bell Laboratories, Lucent Technologies, Agere Systems and Texas Instruments. He has also co-founded two start-up companies (psiloQuest, Inc and Nkanea Technologies, Inc.) dedicated to the development of novel materials for semiconductor and optoelectronics fabrication. He is an inventor on over 50 U.S. and international patents, and has published over 150 papers in various technical publications. Dr. Obeng has a passion for mentoring; he has served on numerous graduate student dissertation committees. He currently holds an adjunct Professorship at Clemson University. He is a Fellow of the Royal Society of Chemistry, UK, Fellow of the American institute of Chemists and Senior Member of IEEE.

Biography of Dave Huntley: 

Dave Huntley was the founder and president of KINESYS Software in 1992. PDF Solutions acquired the Assembly Line Production Supervisor (ALPS) product line from KINESYS Software in 2017. ALPS is widely used in assembly for defect/process tracking and single device traceability. Dave continues to be involved with strategic marketing and business development for ALPS and integrating ALPS into the PDF Solutions Extension product line.

Dave has been involved with SEMI standards development since 1989 starting with the cluster tool standards that led to the GEM 300 standards suite. He was co-chairman of the Sort Map task force responsible for the SEMI E142 Specification for Substrate Mapping Standard, approved in 2006, that enables single device tracking through the assembly process. In 2018, Dave was appointed co-chair for the Single Device Traceability task force working on traceability for the supply chain and counterfeit prevention standards. In 2019, Dave was appointed co-chair for the Advanced Backend Factory Integration task force working on applying and extending wafer fab automation standards to assembly and test. Dave is currently the leader of the team at GSA TIES responsible for liaison with standards organizations and also the development of a white paper on the virtual identifier thread (based on SEMI E142 standard) for security and reliability in the supply chain.

Huntley received a first-class honours degree in Electrical and Electronic Engineering from Bristol University, UK.

Dr. Diganta Das

For more information or questions regarding the technical program (including Professional Development Courses), contact the Conference Chair, Dr. Diganta Das

Kristin Nafstad

For more information or questions regarding event logistics, exhibitions, and sponsorship, contact Kristin Nafstad.