Reliability and Safety Risks in Electronics Products and Systems
CAiRS hosted a public Seminar in Hong Kong where Prof. Michael Pecht and Dr. Das presented the Topics "The Trouble Not Identified Phenomenon in Electronics Products and Systems" and "Reliability and Safety Risks from a Supply Chain in Turmoil," this event attracted 100 attendees from different industries and backgrounds.
The Trouble Not Identified Phenomenon in Electronics Products and Systems:
In some cases, a failure occurs that cannot be verified, replicated at will, or attributed to a specific failure site, mode, and mechanism. Terms used to describe this phenomenon include trouble not identified (TNI), no trouble found (NIF), cannot duplicate (CND), 're-test ok' (RTOK), no-fault found (NFF), and intermittent malfunctions. This talk discussed the concept, causes, and impact of the "trouble not indented" phenomenon with numerous examples in the transportation industry.
Reliability and Safety Risks from a Supply Chain in Turmoil:
This presentation focused on the safeguards one must take to have faith in the reliability assessment and field performance of electronics. The talk reviewed the broad concerns regarding the supply chain and counterfeiting and then concentrated on some supply chain-related solutions.
Few Images from the Event:
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